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T4010S Conformance Test System

Technical Overviews

Overview

The Keysight Technologies, Inc. T4010S conformance test systems includes LTE and LTE-Advanced carrier aggregation (CA), RF and RRM conformance testing, NB-IOT RF, CAT-M1 RF , RF solutions for design verification and pre-conformance of LTE and NB-IOT & CAT-M1 device. The system goes beyond 3GPP-defined LTE RF and RRM conformance test cases, offering a wide range of supplementary test plans required for network operator acceptance as well as support of Regulatory for Europe EN 301 908-13. Compared to competing RF and RRM test systems, the T4010S is the easiest to use test platform available.

Conformance testing

The T4010S conformance test system caters to the specific needs of laboratories at UE and chipset manufactures and third-party certification test houses. It provides a comprehensive set of tools that helps you through the process of entering UE-under-test data into the test system, defining the test plan to be executed, configuring the system to execute the tests according to the specific UE characteristics, analyzing the tests results, and producing the associated test reports.

With an ever-increasing number of bands and frequency combinations, plus the need to support an expanding set of GCF and PTCRB test cases, Keysight is dedicated to an ongoing program of development and validation to make the Keysight T4010S test platform an invaluable and efficient asset for your test laboratory.

Design verification

To address the unique testing needs of baseband and RF hardware developers, the system provides a comprehensive set of test cases following the 3GPP 36.521-1 test specifications for out-of-the-box pre-conformance testing of LTE and NB-IOT and CAT-M1 UE designs.

During the early phases of development, the T4010S DV system lets you create or customize test cases to verify LTE and NB-IOT and CAT-M1 UE RF parametric design characteristics, preventing costly redesigns and modifications in later project phases. That increases confidence and reduces the time-to-market for new LTE and NB-IOT and CAT-M1 UE designs. Its modularity and flexibility also make the system an ideal tool for quality assurance and manufacturing screening.

Key features

The Keysight T4010S conformance test system has the capabilities you need to speed your LTE and NB-IOT and CAT-M1 designs to market:

Easy-to-use test campaign management environment streamlines test execution and result analysis through design verification, conformance test, and supplementary testing.

Reduced operation and maintenance costs—uses the most efficient hardware architecture on the market in terms of testing coverage with standard hardware supporting all active LTE, NB-IOT, FDD CAT-M1 frequency bands and duplex modes.

Automated and unattended RF path compensation procedures.

Clear and immediate access to the test results, including export to different formats (html, CSV, and XML) for extended analysis and archival.

Test beyond the scope of 3GPP conformance. Configure test conditions and LTE signaling to customize your test plan with ease.

Complex testing made simple

This integrated RF and RRM solution will help you from the design and verification stages up to certification of the final product, including operator’s acceptance test plans. Your complex testing is made simple thanks to the T4010S configuration options, ease of use, and automation capabilities.

Accelerate Your Time to Market

Complete 3GPP test case coverage for RF and RRM according to GCF and PTCRB requirements

The T4010S E7515A-based system (GCF/PTCRB TP 195) provides you with the complete set of 3GPP TS 36.521-1 LTE and NB-IOT RF, CAT-M1 RF and 3GPP TS 36.521-3 LTE RRM conformance test cases, validated according to GCF and PTCRB requirements. These test cases include all the duplex/band/bandwidths combinations needed for certification purposes, including bands with different channel bandwidths requirements for GCF and PTCRB. And, as new requirements emerge, Keysight continues to add test cases. For an up to date list of validated tests, please contact Keysight Technologies.

Complete set of RF measurement procedures for UE characterization

As part of design verification the system provides you with a complete set of standard and frequency band-independent test procedures that you can customize. These test procedures cover the complete set of measurements typically required to characterize LTE and NB-IOT and CAT-M1 UEs including:

Power and power control measurements

Global in-channel measurements

Receiver measurements

Receiver performance measurements

CQI, sub-band CQI, and PMI reporting measurements

Occupied bandwidth, spectrum mask, and adjacent channel leakage power ratio measurements

Blocking and intermodulation measurements

Sustained data rate performance measurements

feICIC/eICIC

Integration of E7515A UXM wireless test set

The T4010S system is built around the Keysight Technologies, Inc. E7515A UXM wireless test set, extending the UXM functionality to pre-conformance and conformance testing. It also adds following features:

Receiver test capabilities including flexible channel definitions and closed-loop testing

Frequency division duplex (FDD) and time division duplex (TDD) options

Integrated fading

Out of the channel measurements (OBW, SEM, ACLR)

T4010S conformance test system is based on the E7515A UXM wireless test system and includes the following:

Support for 1CC, 2CC, 3CC, 4CC band combinations and beyond

Sustained data rate

Scalable solution from one box to full system

Dual-feed antenna UE support

2CC FDD/TDD CA intra-band contiguous/non-contiguous inter-band UL CA, and mixed mode test cases

UL CA 64QAM test cases

feICIC/eICIC test cases

3CC FDD/TDD and mixed mode test cases

256QAM DL test cases

4CC test cases

NB-IOT test cases

CAT-M1 test cases

4RX Antenna test cases

HPUE test cases

The Keysight T4010S conformance test system can be scaled to your requirements to support both RF CT and DV, and RRM test cases.

Bench-top configuration

To make it easy to adapt to your changing needs, scalability is one of the key aspects of the T4010S. There are two different bench-top configurations available.

A single E7515A wireless test system can generate up two component carriers and enable testing of in-channel characteristics of the UE´s transmitter and receiver, receiver performance, CSI tests, spurious emission, ACLR, SEM, OBW, as well as TDD CA and sustained data rate test cases.

The single box solution can be easily upgraded to a higher coverage bench-top configuration by adding another E7515A and T1255A LTE multicell combiner unit in order to cover three and four component carrier test cases. Also, this configuration offers dual feed UE antenna support.

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