Scanning Microwave Microscopy (SMM) EMPro

Application Notes

In this application note, we describe electromagnetic (EM) simulations using the Keysight Technologies, Inc. EMPro software1 to support the interpretation of scanning microwave microscope (SMM) experiments. The SMM is a new scanning probe microscope that combines the electromagnetic measurement capabilities of a microwave Performance Network Analyzer (PNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an atomic force microscope (AFM).

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Scanning Microwave Microscopy (SMM) EMPro

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