Column Control DTX

E4980AL Precision LCR Meter

Brochures

Fast measurement speed for more throughput in manufacturing

-12 ms per point at 1 MHz with SHORT mode1

-118 ms per point at 1 MHz with MED mode1

-343 ms per point at 1 MHz with LONG mode1

Average function (up to 256) Enables users to improve measurement repeatability.

Support for a wide variety of test fixtures

The E4980AL can be used with over twenty fixtures to meet a variety of evaluation needs; from materials to SMD components. Also, built-in compensation functions minimize the influence of test fixtures.

USB memory support

The front panel USB memory interface allows you to quickly and easily save state files, measurement log data, and display images to an external USB memory device (mass storage).

PC connectivity

Standard GPIB/LAN/USB control interfaces provide a variety of paths for controlling the instrument. Using a LAN cable, you can even control the E4980AL with a computer and Web browser.

Scanner or handler interface options

The E4980AL offers an optically-isolated 9-BIN handler (Option 201) for integration into handler systems. A 128-channel scanner interface (Option 301) facilitates applications requiring a component scanner. Both interfaces have standard compatibility with other LCR system instruments (e.g. 4284A/88A/78A, etc.) for easy integration into systems. The multi-compensation function enables open/short/load compensations to perform scanning measurements independently in each scanner channel. This minimizes inconsistency in measured values between channels for more accurate measurements throughout the scanner system.

Materials measurements with N1500A measurement suite

The N1500A Option 006 supports the E4980AL with the 16451B and 16452A for materials measurements. The N1500A’s easy- to-use user interface for calibration, limit test, and report generation functions provide versatility when making materials measurements. The N1500A can run on an external PC.

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Column Control DTX