E6706G 1xEV-DO Lab Application

Achieve reliable high data rate testing results and gain confidence in your 1xEV-DO wireless access terminals

As the first one box test set solution to support 1xEV-DO, 1xEV-DO Release A, Release B, and eHRPD, the Keysight Technologies, Inc. E6706G 1xEV-DO lab application in conjunction with the 8960 Series 10 (E5515C/E) wireless communications test set provides a wide range of parametric and functional test capabilities for 1xEV-DO. The E6706G is designed for use in many stages of the mobile device development lifecycle, with the capacity to meet both RF and functional testing needs. This test solution improves the problem-solving efficiency of R&D engineers who design, integrate, verify, and validate leading-edge 1xEV-DO wireless access terminals (ATs).

Key Features

Supports 1xEV-DO Release 0 and Release A default packet application for IP-based application test and verification

Supports 1xEV-DO Release 0 FTAP/RTAP, Release A FETAP/RETAP, and Release B FMCTAP and RMCTAP call processing for accurate physical layer performance qualifications

Release B functionality for testing access terminals that support multicarrier operation and the new subtype 3 physical layer used in 1xEV-DO Release B

Release A default packet application support enables data throughput testing with speeds up to 3.1 Mbps on the forward link and 1.8 Mbps on the reverse link

Protocol logging with the included wireless protocol advisor PC software provides detailed logs at multiple layers in the 1xEV-DO protocol stack for quick debugging of protocol issues

High precision, all digital I/Q baseband fading using the Keysight external Baseband Studio solution (requires incremental hardware) provides all defined fading profiles for 1xEV-DO with digital repeatability and accuracy

Basic mobile IP support in the test set is enabled in the E6706G. Full mobile IP protocol test support through use of the Software Concepts MOB-IP-SIM with the E6706G lab application

IS-856 test mode allows receiver and transmitter testing without call processing

Keysight two-box solution (the new Keysight E7515A UXM wireless test platform, and E5515C/E) supports non-optimized/optimized handover from LTE to eHRPD with enhanced eHRPD functionality

Standardized over-the-air protocol connections

The E6706G 1xEV-DO lab application includes call processing that supports the standardized over-the-air protocols. The 1xEV-DO lab application offers the default packet application used in actual networks for Release 0 and Release A as well as the test application (FTAP/RTAP, FETAP/RETAP, FMCTAP, RMCTAP) used for parametric tests for the 1xEV-DO Release 0, Release A, and Release B air interfaces.

The default packet application emulates the actual 1xEV-DO network by providing data connectivity from the TCP/IP layer (via the rear panel LAN connector) to the access terminal. Sustained data throughput rates can reach full data rates of 3.1 Mbps to an AT and 1.8 Mbps from the AT for the E5515C/E mainframe. The E6706G supports simple IP and basic mobile IP connections and, when combined with the Software Concepts MOB-IP-SIM, provides full mobile IP support.

The 1xEV-DO test application protocols allow quick and efficient control of the forward and reverse operation for accurate parametric testing. FTAP/FETAP/FMCTAP provides packet error rate (PER) measurement capability for RF connections up to 3.1 Mbps. RTAP/RETAP/RMCTAP provides the ability to control the AT’s reverse link to test such parameters as code domain power and waveform quality at all of the available reverse data rates.

Release A test support

The E6706G supports testing of the 1xEV-DO Release A physical subtype 2 air interface using the enhanced test application protocol. Call processing with this new air interface is simple and easy using one button commands, just like it is with the existing Release 0 functionality. The E6706G supports all of the new forward traffic channel configurations and enables accurate PER testing under realistic conditions using the FETAP protocol (forward enhanced test application protocol). Using the new RETAP protocol (reverse enhanced test application protocol), all of the new subtype 2 reverse channel packet sizes and modulation types are easily tested for such parameters as power, waveform quality, code domain power, and conducted spurious emissions.

Release B test support

The E6706G supports testing of the 1xEV-DO Release B physical subtype 3 air interface using the multi-carrier test application protocol. Release B allows user traffic to flow over more than one carrier, which significantly improves data rates. Up to three E5515C/E instruments with the E6706G application (one per carrier) can be synchronized together to perform Release B multi-carrier testing, or one box can be used for multiple carriers in factory test mode only. Using the multi-carrier test application protocol, the 8960 Series 10 test solution supports Tx measurements including waveform quality and frequency accuracy, maximum RF output power, and conducted spurious emissions. Supported Rx measurements include demodulation of forward traffic channel in AWGN, receiver sensitivity and dynamic range.

Hybrid mode

When combined with another E5515C/E running the E6702G cdma2000^® lab application, the E6706G 1xEV-DO lab application supports cdma2000/1xEV-DO hybrid mode operation. The built-in multi-unit synchronization capability allows the two units to be synchronized on CDMA system time to allow for hybrid mode call processing and functional test.

Mobile IP

Basic mobile IP support has been added to the E6706G application that enables the AT to pass mobile IP negotiation. Complete mobile IP and data session handoff tests require the addition of the Software Concepts Inc MOB-IP-SIM. Together, the E6706G, E5515C/E, and the MOB-IP-SIM provide a powerful solution for verifying the AT’s mobile IP protocol behaviors.

Fading tests

Option 004 adds a rear panel digital bus that enables fading when used with Keysight’s N5106A PXB baseband generator and channel emulator. This solution provides receiver fading tests with unprecedented accuracy and repeatability at a very attractive price point. Baseband I/Q data from the E5515C/E is sent via the digital bus to the PXB, where real-time fading is applied based on user-selected fading profiles. After digital fading, AWGN can be digitally added to the waveform. The resulting waveform is then returned to the test set via the digital bus for modulation. This solution eliminates almost all associated calibrations and provides consistent repeatability.