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Application Notes
Graphene, a new member of the carbon family, has stimulated extensive interest in both academia and industry owing to its unique electrical, mechanical, and optical properties. With a monolayer of sp2-bonded carbon atoms arranged in a honeycomb crystal lattice, graphene is a basic building block for all graphitic materials. Graphene-based nanoelectronics, in particular, are the subject of intense research.
Nanomeasurement systems from Keysight Technologies, Inc. offer a broad range of novel atomic force microscopy and field-emission scanning electron microscopy methods, enabling researchers to study the properties of graphene at the nanoscale. Scientists in many diverse fields are authoring a steadily growing stream of published papers based on data obtained using Keysight’s innovative instrumentation and techniques. As well as affording revolutionary low-voltage FE-SEM capabilities, Keysight systems are now the most commonly utilized AFM solutions in the world for graphene research.
The material presented here merely hints at the scope of this dynamic and expansive body of data.
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