Column Control DTX

Complex Modular Generation with Low-Cost AWGs

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Introduction

Digitally modulated signals fill space and travel through almost every wired and optical network. Today, almost all wireless services use a plethora of complex carrier modulation schemes. The continuous improvement in modulation technologies and components and advances in error-correction codes have increased channel capacity close to the fundamental limit as set by the Shannon-Hartley theorem. 

Capacity and efficiency have been improved even more through the development of new transmission strategies such as MIMO (Multiple-In-Multiple-Out) antenna technology and the implementation of extremely flexible multiple-access schemes in the time, frequency, and code domains. Additionally, more and more products and services with decreasing prices rely on the capability of one or more wireless technologies to operate properly. 

This level of complexity and interoperability is made possible only through extensive testing during all the phases of the life of a product or service—from basic technology research to device manufacturing or network deployment. Test equipment flexibility is paramount to successfully address those needs. The overall cost of test equipment is also important so team leaders can make sure the equipment is available to all engineers throughout the entire project

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Column Control DTX