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Taking SEM Images of Insulating Materials with LV SEM

Application Notes

Scanning electron microscopy has become a popular imaging tool in different areas of science and engineering. Being able to elucidate the structure of a material at the micro-and/or the nano-scale level is indeed crucial to characterizing the material, understanding its mechanism and mode of formation, and explaining/predicting its properties and performance under a given set of environmental or load conditions. Secondary electron imaging is commonly used to reveal surface topography, grain morphology and size, phase composition, and fracture profile. In such cases highest resolution and contrast are needed to illustrate the finest structural features. However, imaging of organic and biological specimens represents a real challenges to investigators. We discussed briefly in a previous note the options available to overcome these difficulties. With the Keysight Technologies, Inc. 8500 low voltage scanning electron microscope (FE-SEM), imaging of organic and biological materials is strongly facilitated.

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