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Application Notes
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters.
As our high-speed signal environment keeps getting faster, circuit elements that were generally benign at lower frequencies are taking on whole new characteristics. Generally, between the measurement point and the point of interest there can be any number of parasitic circuit elements that will affect the waveform. Circuit traces become RF antennas with all the parameters of a transmission line. Circuit boards become complex circuits with all the trimmings of a complex resistance/inductance/capacitive (RLC) network. Test points become impedance incongruences and probe tips and cables become reactive networks. Therefore, it is safe to say, in many cases, what is directly measured from the oscilloscope isn’t really what we want. The challenge is to extend the oscilloscope’s ability to render waveforms that represent different circuits and/or circuit locations from what is probed or directly measured.
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