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U7231B, U7231C DDR3 and LPDDR3 Compliance Test Application

Data Sheets

Test, Debug and Characterize Your DDR3 and LPDDR3 Designs Quickly and Easily

The Keysight Technologies, Inc. U7231B DDR3 and LPDDR3 compliance test application provides a fast and easy way to test, debug and characterize your DDR3 and LPDDR3 designs. The tests performed by the U7231B software are based on the JEDEC 1 JESD79-3F and JESD79-3-1 DDR3 SDRAM Specification. In addition, the application features Custom mode, which covers crucial measurements such as eye-diagram, mask testing, ringing and other tests that are not covered in the specifications but are critical for characterizing DDR3 and LPDDR3 devices. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis.

DDR3 is an evolutionary upgrade to DDR2 and DDR1 memory systems. DDR3 technology enables even higher bandwidth for data transfer than DDR2 and allows you to build devices with even smaller chip footprints that consume less power and generate less heat. DDR3 achieves these advances with enhanced fine ball-grid array (FBGA) packaging, enhanced on‑die termination, self calibration and automatic self-refresh for improved control of signal integrity.LPDDR3 DRAM with data rate up to 1600MT/s is 50% faster than the industry’s current highest performance LPDDR2, which operates at 1066MT/s. The new LPDDR3 also operates at lower electrical power than LPDDR2 which help reduces power consumption in the mobile applications. Signal integrity is crucial for memory system interoperability. Reference clock jitter measurements help you ensure that jitter is well within the specifications, which is the key to reliable and interoperable modular memory systems. At the same time, electrical and timing characteristics of other signals are critical as well, to ensure the memory system functions correctly and stays error free.

The addition of the DDR3 and LPDDR3 debug tool helps memory designers perform pre- and post-compliance testing with saved oscilloscope waveform traces. The tool allows for navigation capability with measurement markers to help navigate to problem areas for further testing.

The U7231B DDR3 and LPDDR3 compliance test application is compatible with Keysight Infiniium digital storage oscilloscopes.

Features

The DDR3 and LPDDR3 compliance test application offers several features to simplify the validation of your designs:

  • New setup wizard for quick setup, configuration and test
  • Enhanced execution speed and proven test algorithm for clock test, which minimizes your compliance test time
  • User-selected tests and configurations based on JEDEC JESD79-3F and JESD79-3-1 Specification data rate with option to turn on LPDDR3 data rate tests and user-defined speed for embedded designs
  • Option to use phase difference or mixed signal oscilloscope read-write command trigger, allowing robust read and write separation for JEDEC measurement
  • New wizard tool to automate voltage threshold settings for non-standard operating voltages adds flexibility in characterization work
  • Ability to analyze the loading effect of adjacent RANK of the same memory channel
  • Test framework provides powerful characterization through multiple trials that show a full array of statistics for each measurement and returns the worst measurement value
  • Automatically perform derating table calculations for setup and hold time measurements based on slew rate
  • DDR debug tool allows for navigation to area of interest in a saved set of waveforms with JEDEC measurement for pre- and post-compliance testing
  • Offline setup allows for compliance testing on saved waveform files from oscilloscope or ADS simulation tool

Comprehensive test coverage

With the DDR3 and LPDDR3 compliance test application, you can use the same oscilloscope you use for everyday debugging to perform automated testing and margin analysis based on the JEDEC electrical and timing specifications. The application automatically configures the oscilloscope for each test and provides informative results. It includes margin analysis indicating how close your device comes to passing or failing the test for each specification.

Some of the difficulties in performing DDR3 tests are connecting to the target device, configuring the oscilloscope, performing the tests and analyzing the measured results. The DDR3 compliance test application does most of this work for you. If you discover a problem with your device, the Custom mode feature in the test application and debug tools in the oscilloscope are available to aid in root-cause analysis.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing DDR3 devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. On the environmental setup page, you can select the type of DDR3L or LPDDR3 devices, and the framework automatically filters the tests based on your selection. You have the option to use the conventional DQS-DQ phase difference or MSOX logic triggering (used only with MSO90000X series Infiniium oscilloscopes) for read and write separation. You can then select a category of tests or specify individual tests. The user interface is designed to minimize unnecessary reconnections, which saves time and minimizes potential operator error. You can save the tests and configurations as project files and recall them later for quick testing and review of previous results. Clear menus let you perform tests with minimum mouse clicks.

The threshold setting wizard helps user automate voltage threshold settings for non-standard operating voltages to increase flexibility to test in non-standard operating voltages.

DDR debug tool is a license tool that enables JEDEC measurement on saved waveform traces with navigation capability and markers to identify problem areas for debug and margin testing.

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