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Application Notes
To ensure compliance with manufacturing specifications, single-point pass/fail DC testing must be performed on packaged diodes. Because these tests are also used to identify and remove defective devices before shipment, their reliability is important to guarantee product quality. In addition, it is also essential to perform the tests quickly to keep the production throughput high.
Keysight B2901/02/11/12A Precision Source/Measure Unit meets all of these requirements, making it the best solution for diode production test. It is a compact and cost-effective bench-top Source/Measure Unit (SMU) with the capability to source and measure both voltage and current. They cover currents from 10 fA to 3 A (DC)/10.5 A (pulse) and voltages from 100 nV to 210 V. In addition t o these comprehensive measurement capabilities, the B2900A Series of SMUs possesses high throughput that reduces test times. The B2900A Series of SMUs also has many features that make it well-adapted for production test, such as pass/fail binning, a digital I/O interface for handler control, and code compatibility with standard single and dual channel SMU products.
This application note shows how to use the B2900A Series of SMUs for production test. A simple diode test example will be shown for a forward voltage test (VF).
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