Column Control DTX

E5061B Network Analyzer, 100 kHz to 1.5 GHz/3 GHz, 5 Hz to 3 GHz

Brochures

E5061B Responds to Various Measurement Needs, From LF to RF

The Keysight Technologies, Inc. E5061B is a member of the industry standard ENA Series network analyzers. The E5061B addresses a broad range of measurement needs of electronic components and circuits from low to high frequencies.

The E5061B is the ideal solution for applications in industries such as wireless communications, aerospace and defense, computer, medical, automotive, CATV, plus many more. The E5061B now provides a new standard of frequency-domain device analysis from 5 Hz to 3 GHz.

RF NA options

E5061B-115/215/135/235: 50 Ω

E5061B-117/217/137/217: 75 Ω

Economy RF network analyzer that offers solid performance for basic RF network measurements

  •  100 kHz to 1.5 GHz/3 GHz
  •  Transmission/Reflection test set and S-parameter test set
  •  50 Ω and 75 Ω system impedance
  •  Wireless power transfer analysis function (Option 006)

LF-RF NA options

E5061B-3L3/3L4/3L5

General-purpose network analyzer with comprehensive functionality to support network and impedance measurements for electronic devices from LF to RF

  •  5 Hz to 500 MHz/1.5 GHz/3 GHz
  •  50 Ω S-parameter test set
  •  Gain-phase test port (1 MΩ/50 Ω inputs)
  •  DC bias source
  •  Impedance analysis function (Option 005) 1
  •  Wireless power transfer analysis function (Option 006)

Advanced Measurement Capabilities in a Compact Box

RF NA Options (100 kHz to 1.5/3 GHz)

E5061B-115/215/135/235: 50 Ω,

E5061B-117/217/137/237: 75 Ω

Solid performance in an enhanced platform

The E5061B RF NA options provide high-performance 1- and 2-port network analysis at an affordable price. The established RF performance of the E5061/62A has been integrated into this new digital platform.

A wide variety of test set options allows you to select the best configuration to suite your test requirements and budget. Enhanced digital processing capabilities and a smaller footprint improve the throughput and efficiency for testing RF components, including cellular BTS filters/antennas, MRI coils, RFIDs, CATV components, and more.

Expanded frequency range

An expanded lower-end frequency range down to 100 kHz allows you to test components that require measurements in the 100 kHz range, such as LAN filters and automotive antennas.

Time domain/Fault location analysis

(Option E5061B-010)

The time gating function is available in the time domain/fault-location analysis function. This enables you to eliminate mismatch errors caused by test fixtures when testing CATV cables.

LF-RF NA Option (5 Hz to 500 MHz/

1.5 GHz/3 GHz) E5061B-3L3/3L4/3L5

Comprehensive LF-to-RF network analysis

The E5061B-3L3/3L4/3L5 LF-RF NA option offers versatile network analysis in the broad frequency range from 5 Hz to 500 MHz/1.5 GHz/3 GHz.

Comprehensive LF network measurement capabilities including built-in 1 MΩ inputs have been seamlessly integrated with the high-performance RF network analyzer. The E5061B-3L3/3L4/3L5 is the right solution for component and circuit evaluations in the R&D environment.

S-parameter test port

The built-in S-parameter test set of the E5061B-3L3/3L4/3L5 covers 5 Hz to 500 MHz/1.5 GHz/3 GHz with excellent dynamic range performance. This allows you to evaluate a variety of devices from near DC to RF ranges.

Gain-phase test port

The gain-phase test port provides direct receiver access for LF applications from 5 Hz to 30 MHz. The built-in 1 MΩ

inputs allow you to easily perform in-circuit probing measurements for amplifiers and DC-DC converter control loops1. The receiver ports can accurately measure amplifier’s CMRR/PSRR and PDN milliohm impedance by eliminating the measurement errors associated with the ground loop.

DC bias source

The E5061B-3L3/3L4/3L5 has a built-in DC bias source which internally superimposes the DC voltage up to ±40 Vdc onto the AC source signal at port-1 or LF OUT port. Also, it is possible to provide only the DC voltage from LF OUT port while measuring a DUT at the S-parameter test port.

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