Solutions for Characterizing Complex and Multi-Stage Circuits

Application Notes

Large signal models can provide an ideal form for nonlinear device characterization. Such models are especially beneficial in the design of complex or multi-stage circuits because they can enable analysis of performance for varying drive and impedance conditions. Much work has been devoted to large signal model development at microwave frequencies. While the models can be accurate over certain regions of the device operation, they may fail in other areas. Since they are typically extrapolated from DC and small-signal measurements, verification under actual largesignal operation is generally required with mixed results. In many cases of practical interest, the device is used over a wider range of voltage and current than can even be characterized under DC and linear Scattering parameter (S-parameter) conditions, which can lead to errors.

X-parameters* are a measurement of a device under actual operating conditions which include large-signal operation. The vector load impedance dependency can now be included with S-parameters for non-50 ohm devices using traditional load pull tuners.

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Solutions for Characterizing Complex and Multi-Stage Circuits

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