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Application Notes
Complementary Metal–Oxide–Semiconductor (CMOS) Field Effect Transistor (FET) technology continues to be the basis for large scaled integrated circuits such as microprocessors and memory devices. CMOS technology is now so pervasive that it is intimately interwoven into the fabric of people’s everyday lives in items such as cell phones, high deinition TVs and computers.
The key challenges to improving CMOS device performance are the opposing goals of high speed operation and low power consumption. To achieve both simultaneously, researchers need to fully characterize MOSFET parameters. This includes not only static (DC) behavior but also the dynamic and time-dependent characteristics of the devices.
The Keysight Technologies, Inc. 4155 and 4156 semiconductor parameter analyzers have been the industry standard for almost twenty years. The Keysight B1500A Semiconductor Device Analyzer is the next-generation semiconductor parameter analyzer, and it possesses the measurement capabilities necessary to accurately characterize advanced CMOS devices.
EasyEXPERT, the B1500A’s resident control software, comes standard with ready-to-use measurement libraries. These libraries cover the evaluation of both basic and advanced CMOS device parameters, including reliability test.
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