High Frequency Technology Center IC Selection Guide

Selection Guide

Keysight MMICs

Overview

Keysight Technologies, Inc. MMICs are designed and fabricated in Santa Rosa, California in our High Frequecncy Technolocy Center (HFTC). HFTC is a supplier of high performance semiconductor based solutions to customers in instrumentation, communications, and defense electronics markets.

Driven by performance, quality, and reliability requirements of Agilent Technologies test instrumentation, HFTC has developed a leadership position in supplying high frequency IC “building blocks,” as well as custom semiconductor solutions from RF to mm-wave frequencies. HFTC’s research and manufacturing investments are managed to deliver superior value to customers through:

– Performance

– Reliability

– Fast time to market

– Assured supply

– High level product support

Technology

HFTC has been shipping Compound Semiconductor (III-V) based ICs in test equipment applications since 1985. At the present time, there are eight III-V IC, and two GaAs integrated diode processes in manufacturing. Over 300 different ICs have been designed in these processes and are shipping at a rate of over 100,000 ICs per month. Over 16 million GaAs ICs have been shipped from these processes to customers in a wide variety of markets. Our current products include:

– Ampliiers

– Synthesis ICs

– Digital ICs

– ICs diodes

– I/Q modulators

– Mixers

– Multipliers

– Prescalers

– Switches/attenuators

Current processes

– 350 nm MESFET—24 GHz Ft

– 250 nm pHEMT—60 GHz Ft

– 110 nm pHEMT—95 GHz Ft

– 2x2 μm InGaP HBT—70 GHz, 16 V BVcbo

– 2x2 μm Power HBT—45 GHz, 26 V BVcbo

– 1x3 μm InP DHBT—185 GHz, 7 V BVcbo

– Hyper-abrupt diode

– Modiied barrier diode

Reliability

Reliability is designed into all HFTC processes and products in keeping with Keysight’s long standing instrument tradition. To assure this reliability we use a two-phase process. Phase 1 consists of quantitatively determining the lifetime, or failure rate of the circuit at its maximum rated use conditions. The failure rate of a circuit is generally determined by the following tests:

– Thermal resistance measurement

– Step stress test (to failure)

– High temperature operating life

Phase 2 of the reliability program assesses the environmental ruggedness of the circuit. This phase determines the circuit’s:

– Sensitivity to humidity

– ESD damage thresholds

– RF power handling (damage level)

Modeling Simulation and Characterization

Overview

HFTC has capitalized on our unique intersection of expertise in semiconductors, measurements, software, and modeling science to create world-class models and tools. This enables the creation of differentiating IC and module designs to economically push the envelope in product design, cost, and performance.

Keysight Technologies' X-parameters* are a new category of nonlinear network parameters for high-frequency design, and were developed and introduced by Keysight in 2008 as functionality included in the nonlinear vector network analyzer (NVNA), and the Advanced Design System. X-parameters are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.

X-parameters characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports. They correctly characterize impedance mismatches and frequency mixing behaviors to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as ampliiers and mixers in wireless design.