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E5071C ENA Option TDR Enhanced Time Domain Analysis

Technical Overviews

Technical Overview

Introduction

One box solution for high speed serial interconnect analysis

- Simple and Intuitive Operation

- Fast and Accurate Measurements

- ESD Robustness

Why choose ENA Option TDR for your toughest high speed serial interconnect measurement challenges?

As an engineer you’re no stranger to tough challenges that help you to deliver high standards and meet your customer’s needs better than anyone else can. But deploying your next design successfully is even more difficult when you’re incorporating today’s high speed serial technologies.

Signal eyes become smaller and measurement error from your instrument becomes less tolerable. Keysight Technologies, Inc. is committed to providing the best measurement solutions for those tough measurement challenges.

The Keysight ENA Option TDR provides the following three breakthroughs for signal integrity design and verification:

- Simple and Intuitive Operation

- Fast and Accurate Measurements

- ESD Robustness

Key features

- Up to 20 GHz of bandwidth with 22.3 ps rise time enables measurement on the latest high speed serial standards

- Unmatched performance

- Wide dynamic range to observe the true performance of your DUT: > 100 dB

- Low noise floor for accurate and repeatable measurements: 20 uV rms

- Fast measurement speed for real-time analysis: 41 msec at 1601 points with full 2-port calibration performed

- State-of-the art calibration techniques reduce measurement errors

- Automatic deskew ensures easy removal of fixture and probe effects

- Full calibration available for the utmost in measurement accuracy

- Upgrade all available ENA hardware and software options (bandwidth, number of ports, etc.) at any time

Keysight E5071C ENA Option TDR

One-box solution for high speed serial interconnect analysis

As bit rates of digital systems increase, signal integrity of interconnects drastically affects system performance. Fast and accurate analysis of interconnect performance in both time and frequency domains become critical to ensure reliable system performance.

Because managing multiple test systems becomes difficult, a single test system that can fully characterize differential high speed digital devices is a very powerful tool

The ENA Option TDR provides an one box solution for high speed interconnect analysis, including impedance, S-parameters, and eye diagrams.

TDR oscilloscope look-and-feel

The graphical user interface is design to provide a similar look-and-feel to traditional TDR oscilloscopes. You can easily set up complex measurements and quickly retrieve measurement data.

TDR/TDT and Eye/Mask Modes

Quickly change between observing the eye to making fast and accurate TDR/TDT and S-parameter measurements with a single mouse click.

Dedicated controls for common adjustments

Software knobs provides simple controls for commonly used functions.

Keysight E5071C ENA Option TDR

One-box solution for high speed serial interconnect analysis

Features

- Quickly obtain accurate TDR/TDT and S-parameter measurements

- Easily locate source of loss, reflections and crosstalk by simultaneous analysis of both time and frequency domains

- Single connection forward and reverse transmission and reflection measurements

- All possible modes of operation (single-ended, differential , and mode conversion)

- Measure just your device by utilizing advanced calibration techniques to remove cable, fixture, and probe effects

As bit rates of digital systems increase, the combination of both time domain and frequency domain analysis becomes important to ensure reliable system performance.

The ENA Option TDR provides simultaneous analysis of both time and frequency domains. The ENA Option TDR measures the characteristics of a test device as a function of frequency. The frequency domain information is used to calculate the inverse Fourier transform for time domain results.

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