Column Control DTX

Instrumented Indentations with Oliver and Pharr Method

Application Notes

The scale of materials and machined components continues to decrease with advances in technology making traditional test systems increasingly more difficult to use for determining mechanical properties. For this reason instrumented indentation testing (IIT) or depth sensing indentation (DSI) testing is becoming the technique of choice for determining mechanical properties of materials on the micro and nano scales. Based off of research by Sneddon, W.C. Oliver and G.M. Pharr published a landmark paper on IIT in 1992, which laid the foundation for much of the ongoing research and development in the fields of materials science and engineering. The instrument used for this seminal paper was the first design of what has now become the Keysight Technologies, Inc. Nano Indenter G200.

Instrumented indentation testing is similar to a hardness test in that a rigid probe is pushed into the surface of a material. Traditional hardness tests return one value of hardness at a single penetration depth or force and for most techniques the calculation of this single valued measurement requires the area of the residual hardness impression to be measured either optically or by microscopy. IIT is an improvement to traditional methods because there is no need to measure the area of the residual impression. With instrumented indentation testing the area of contact is calculated from the load-displacement history which is recorded continuously throughout the experiment. 

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Column Control DTX