Column Control DTX

N5465A InfiniiSim Waveform Transformation Toolset for Infiniium Oscilloscopes

Data Sheets

The InfiniiSim Waveform Transformation Toolset for Infiniium oscilloscopes is co-simulation software that derives transfer functions to convert, or filter, an acquisition to portray a waveform at a different circuit location or different circuit rendering than where probed.

Reasons to use InfiniiSim:

De-embed fixtures or cables or switch networks that are placed between the oscilloscope and the device to be measured

Embed cable models as required by several digital standards, or view signal degradation with an inserted element for link margin analysis

View waveforms in physically un-probable locations

Compensate for loading of probes or other circuit elements

Compare different circuits by changing, adding or deleting circuit elements

InfiniiSim works by relating the transfer functions of two circuits to yield an overall transfer function between them. The two circuits (the ‘measurement circuit’ and ‘simulation circuit’) are defined by the user. The measurement circuit represents the measurement setup the user has on the bench, while the simulation circuit represents the circuit the user would like have. As an example, the measurement circuit shown in Figure 1 comprehends a source device being measured by an oscilloscope with a cable in between. The simulation circuit has the cable removed. By relating the observation points in both circuits (the same location in this instance) to the source voltage, an overall transfer function that removes the effects of the cable results.

InfiniiSim works by relating the transfer functions of two circuits to yield an overall transfer function between them. The two circuits (the ‘measurement circuit’ and ‘simulation circuit’) are defined by the user. The measurement circuit represents the measurement setup the user has on the bench, while the simulation circuit represents the circuit the user would like have. As an example, the measurement circuit shown in Figure 1 comprehends a source device being measured by an oscilloscope with a cable in between.

  1. Removal of channel element insertion loss (Advanced and Basic) .Description: One block of loss such as from a cable or fixture between a digital source and the oscilloscope. The inverse gain of the block (S21-1) is determined and its time response is convolved with the acquisition.
  2. Inserting a channel element insertion loss (Advanced and Basic) .Description: One block of loss such as from a standard cable model to be inserted before the oscilloscope. The S21 of the block is determined and its time response is convolved with the acquisition.
  3. Remove scope input reflection (Advanced only) .Description: Modeled using two blocks - one for the transmitter source and the other for the oscilloscope input (so the oscilloscope input reflection can be removed)
  4. Remove all effects of a channel element (Advanced only) .Description: Using S-parameter models of source and scope load, the effects of a channel element are totally removed. This is different from 1 above (removing insertion loss) in that the interactions between the elements are taken into account. This provides the most accurate way to remove a channel element.
  5. Add all effects of a channel element (Advanced only) .Description: Using S-parameter models of source and scope load with, a complete insertion of a channel element is performed. This is different from the Inserting a channel element insertion loss (#2 above) in that the reflective interactions between the elements are taken into account. This provides the most accurate rendering to insert a channel element such as a standard cable.
  6. Replace one channel element with another (Advanced only) .Description: Modeled after removing or adding all effects of a channel element, one channel element block is easily substituted for another. Interactions between transmitter and oscilloscope elements are taken into account.
  7.  Measurement plane relocation (Advanced only) .Description: Measurement plane relocation allows you to view any voltage waveform in a circuit as the circuit exists by moving the simulation node to any location you desire. This is an ‘in situ’ analysis so is not a ‘removal’ or ‘insertion’ viewpoint.
  8. Relocate the observation node of a probed measurement (Advanced only) . Description: View any voltage waveform in the probed circuit as the circuit exists by moving the simulation node to any location you desire. This is an ‘in situ’ analysis so it is not a ‘removal’ or ‘insertion’ viewpoint.
  9. Remove loading effects of oscilloscope probe (Advanced only) .Description: To remove the loading effects of a probe, a topology of circuit blocks is given that allows probe models to be considered in the measurement. An oscilloscope probe, while it might be defined as ‘high impedance’, really does have a loading effect on the circuit. This effect can be taken into account and removed
  10. Remove loading effects of a DDR interposer and probe (Advanced only).Description: To remove the effects of an interposer board in validating a dual data (DDR) memory system where the signals of the ball grid array (BGA) are not exposed and are unavailable for direct probing
  11. General purpose configuration (Advanced only) . Description: General topologies are provided for greater flexibility. General purpose probe, 6 block, and 9 block topologies are available with user defined measurement and simulation points and each block can be defined as having combinations of up to three elements in cascade or parallel arrangement so 27 total circuit elements can be defined for the most sophisticated scenarios.

 

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX