Choose a country or area to see content specific to your location
Application Notes
This paper describes how to get the most from Network Parameter Measurement (NPM) capability on the Keysight Technologies, Inc. Medalist i3070 in-circuit test (ICT) system using enhancements in software version 7.20p. It is targeted at critical elements for NPM success. For general NPM and VTEP guidelines, refer to the white paper “Maximising Test Coverage with Keysight Medalist VTEP v2.0” found at www.keysight.com/see/vtep
NPM is a sensitive measurement requiring much greater care in ixturing and development than standard VTEP.
Unlock Content
Sign up for free
*Indicates required field
Thank you.
Your form has been successfully submitted.
Note: Clearing your browser cache will reset your access. To regain access to the content, simply sign up again.
×
Please have a salesperson contact me.
*Indicates required field
Thank you.
A sales representative will contact you soon.