Column Control DTX

Impedance Measurements of EMC Components with DC Bias Current

Application Notes

Recent developments in semiconductor and communications technologies have accelerated the expansion of digital technology applications to more and more fields including home electronics and automotive parts and accessories.

 

Meanwhile, in order to cope with ever-increasing amounts of data, the demand for higher communication speeds has been increasing daily. In addition, developers are faced with stricter electromagnetic compatible (EMC) and noise control requirements and the increasingly complicated challenge of meeting today’s standards and needs for power saving, low voltage design, smaller components, etc. EMC/noise control requirements will continue to become stricter and stricter.

 

Using ferrite beads as an example, this application note gives an overview on how to correctly evaluate EMC components in a way that satisfies these strict requirements. It also introduces various EMC measurement solutions.

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Column Control DTX