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Improving Flash Memory Test Applications Using the B1500A

Application Notes

– HV-SPGU outputs ±40 V three level pulses

– One million write/erase cycle endurance test can be performed within an hour

– More than twenty flash memory test applications are ready to use for fast start-up

– ALWG function enables the novel non-volatile memory test

 

The flash memory market is growing rapidly, driven by MP3 music players, digital camera storage media and the expectation of replacing smaller hard disk drives in the near future. Accompanying this growth is the need to increase memory sizes by reducing the memory cell area through such means as multi-bit or multilevel cell (MLC) and charge trap flash memory. The write/erase characterization of these modern high-density NAND flash memory processes presents many new measurement challenges, such as the generation of extremely accurate voltage pulses and the creation of arbitrary waveforms.

 

The Keysight Technologies, Inc. B1500A Semiconductor Device Analyzer’s new Keysight B1525A High Voltage Semiconductor Pulse Generator Unit (HV-SPGU) provides the accuracy and flexibility to meet the write/erase testing needs of these advanced non-volatile memory technologies. In addition, the B1500A and HV-SPGU offer substantial throughput improvements for write/erase cycle endurance lifetime testing. This application note explains how the B1500A can meet all of these exacting challenges and requirements.

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