Choose a country or area to see content specific to your location
Application Notes
Measuring electromagnetic properties of materials can provide insight into applications in many areas of science and technology, and increasingly, these properties need to be evaluated at the nanometer scale. Since electromagnetic properties, such as the dielectric constant, are ultimately related to a material’s molecular structure, correlating the detailed physical structure of a material with its electromagnetic properties is frequently more valuable than the knowledge of either alone.
Scanning Microwave Microscope (SMM) Mode is a new Scanning Probe Microscope (SPM) that combines the electromagnetic measurement capabilities of a microwave vector network analyzer (VNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an Atomic Force Microscope (AFM).
Unlock Content
Sign up for free
*Indicates required field
Thank you.
Your form has been successfully submitted.
Note: Clearing your browser cache will reset your access. To regain access to the content, simply sign up again.
×
Please have a salesperson contact me.
*Indicates required field
Thank you.
A sales representative will contact you soon.