Flyers
Keysight Technologies, Inc. Medalist VTEP v2.0 Powered! is a comprehensive suite of test tools designed to tackle today’s test challenges.
Technological advances are putting tremendous pressures on manufacturing test. Nearly every segment of the electronics industry is affected by these trends:
High Speed Signal Propagation (HSSP) The VTEP v2.0 Powered! test suite comprises:
What is Cover-Extend technology?
Cover-Extend technology is a hybrid between VTEP and boundary scan. It draws the best from what each technology offers and enhances the overall capability of Keysight in-circuit test systems. Here are the key contributions of the constituent technologies:
VTEP
Simple, robust and fast measurement using VTEP sensors.
Boundary scan
A world-wide standardized test methodology (IEEE 1149.x standard). Limited-access capability – ability to control the I/O functions of individual pins through the use of only four pins of the test access port (refer to Figure 1 overleaf).
Key benefits of Cover-Extend
Test coverage without test access
Cover-Extend protects your investment in ICT as well as opens up opportunities for access-limited users who have not traditionally considered ICT as part of test strategy to do so now.
Lower cost of test
With lesser need for physical test access*, there comes significant savings on operational cost like fixturing and ICT test resources. For instance, you can now save on cost of test probes and associated cost like wiring and maintenance. Also, you can minimize your need for ICT pin cards required to test your PCBAs
How does it work?
The VTEP sensor, which is able to capacitively pick up stimulus signals, is placed on the component to be tested (e.g. a connector).
Traditional VTEP methodology required physical test access (i.e test probes) to deliver this stimulus signal. However, with Cover-Extend, the stimulus signal is delivered via a boundary scan device.
The boundary scan device does not require test probes on every pin.
As per the IEEE 1149.x standard, using only the test access port, users can deliver the necessary stimulus signal to the connector.
A defect (e.g. an open) on the path between the boundary scan device and the VTEP sensor will affect the stimulus signal that is bound for the sensor.
The result is captured and diagnosed by the ICT system and thus, the defect is detected!
×
Please have a salesperson contact me.
*Indicates required field
Thank you.
A sales representative will contact you soon.