Column Control DTX

N9069A & W9069A Noise Figure X-Series Measurement Application

Technical Overviews

  • Characterize noise figure and gain of connectorized devices and system blocks with graphic, meter, and table views
  • User-definable sweep time and noise source settling time
  • Fully-specified measurements with optional internal preamp; improved specifications with external USB preamp
  • 50 GHz internal uncertainty calculator
  • Noise figure measurements to 110 GHz (Option 526 or greater required) with Keysight Technologies, Inc. K-Series block downconverters
  • Move application between X-Series signal analyzers with transportable licensing

Noise Figure Measurement Application

Noise figure is one of the fundamental parameters that differentiates one system, ampli­fier, or transistor from another. To minimize the problems resulting from noise generated in receiver systems, engineers can either make a weak signal stronger, or reduce the noise of that system or its individual components. Keysight’s N/W9069A noise figure measurement application offers development engineers a simple tool to make accurate and repeatable noise figure measurements. Pair this measurement application with an Keysight X-Series signal analyzer for fully specified results up to 26.5 GHz on the CXA, CXA-m MXA and MXE, up to 44 GHz on the EXA, and up to 50 GHz on the PXA. The speed of this application also allows manufacturing engineers to rapidly measure any one of the following in their test racks:

  • Noise figure/factor
  • Gain
  • Effective temperature
  • Y-factor
  • Hot/cold power density

The noise figure application utilizes the Y-factor method for calculating noise figure. By using a noise source, X-Series signal analyzers or the MXE EMI receiver can quickly determine the noise of the device under test. This method is very simple, as it utilizes a ratio of two noise power levels: one measured with the noise source ON and the other with the noise source OFF.

The U7227A/C/F USB preamps are available to reduce the uncertainty of Y-factor noise figure measurements to 44 GHz. With these preamps and an X-Series signal analyzer, you can obtain better noise figure measurements than with a dedicated noise figure analyzer such as the N8973/ 4/5A.

When using this application on an X-Series signal analyzer or MXE EMI receiver, engineers will also benefit from full RF signal analysis capabilities in one instrument. In addition, the noise figure measurement application is code-compatible with previous Keysight noise figure solutions where hardware and measurements are the same. The application can be configured for remote programming via USB, LAN, or GPIB—all of which are standard for X-Series.

Definitions

Specifications describe the performance of parameters covered by the product warranty.

95th percentile values indicate the breadth of the population (≈2) of performance tolerances expected to be met in 95% of cases with a 95% confidence. These values are not covered by the product warranty.

Typical values are designated with the abbreviation "typ." These are performance beyond specification that 80% of the units exhibit with a 95% confidence. These values are not covered by the product warranty.

Nominal values are designated with the abbreviation "nom." These values indicate expected performance, or describe product performance that is useful in the application of the product, but is not covered by the product warranty.

Analyzer noise figure is computed from the specified DANL. See specifications on following pages for further explanation.

Analyzer VSWR is characterized to the 95th percentile but not measured and warranted. USB preamp VSWR is measured and warranted and becomes the input VSWR of the measurement system when used.

Instrument uncertainty is defined for gain measurements as uncertainty due to relative amplitude uncertainties encountered in the analyzer when making the measurements required for the gain computation.

The noise figure measurement application is not specified for use below 10 MHz. Instru­ment uncertainty will nominally be the same as the 10 MHz to 3.6 GHz specifications; however, performance is not warranted. Instrument uncertainty for gain is characterized to the 95th percentile above 3.6 GHz.

These notes apply to the following specifications. For more information on configuring an X-Series signal analyzer for noise figure measurements, depending on the DUT noise figure gain, see the Noise Figure Measurement Guide, literature number N9069-90006.

Analyzer VSWR is characterized to the 95th percentile but not measured and war­ranted. The VSWR measurement is made on the PNA-X which is traceable. The reverse isolation of the USAB preamp is high enough that the system VSWR is insignificantly affected by the analyzer VSWR. So the system VSWR is the warranted VSWR of the USB preamp.

Analyzer noise figure is computed from the specified DANL using NF = D – (K – L + B), where D is the DANL (displayed average noise level), K is kTB (–173.98 dBm in a 1 Hz bandwidth at 290 K), L is 2.51 dB (the effect of log averaging used in DANL verifications), N is 0.24 dB (the ratio of the noise bandwidth of the RBW filter with which the DANL is specified to an ideal noise bandwidth), B is ten times the base-10 logarithm of the RBW (in hertz) in which the DANL is specified. B is 0 dB for the 1 Hz RBW. The actual NF will vary from the nominal due to frequency response errors. Frequency response errors help as often as they harm, so NF derived from the DANL is a very good approximation to the true NF. Any other uncertainties created by deriving the noise figure are small second-order uncertainties the GUM does not require.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX