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Post Processing Pico Image Software for Keysight AFM Systems

Data Sheets

Post Processing Pico Image Software

for Keysight AFM Systems

Pico Image surface imaging and analysis software is dedicated to Keysight Technologies AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

The intuitive Pico Image desktop publishing user interface and comprehensive online help system guarantee ease of use. The surface metrology report is built visually, starting with multiple channel measurement files (for example, topography, amplitude, and phase) that can be correlated. Intelligent filters produce high-quality images, make hidden surface features visible, and separate different frequencies (such as very high frequencies, roughness, and waviness). Pico Image automatically assembles overlapping measurements made on a horizontal grid allowing multiple measurement to be stitched together into a single surface image. (Figure 4.) Real-time 3D imaging provides excellent visualization. Videos of flight paths over a surface can be integrated into the perfect presentation.

Analytical studies generate all of the information needed to characterize a surface, a profile, or a series of profiles extracted from a surface. 2D and 3D parameters are generated in accordance with international standards. Unique features in Pico Image Advanced and Expert include the ability to generate sub-surfaces and work with them seamlessly as well as the ability to analyze multiple measurement datasets automatically by applying a template.

Options are available for the characterization of grains and particles, image co-localization, the analysis of wavelets, and for generating statistics. Pico Image is the ideal analysis software package for use with Keysight AFMs and SPMs. It is integrated into our high-precision instruments.

Pico Image Basic

Pico Image Basic includes all of the features and functions required to build a basic surface analysis report on multi-layer measurement data that is input from Keysight AFMs and SPMs. The user can work in English, French, German, Italian, Polish, Spanish, Japanese, Chinese or Russian to build the analysis document. The document consists of a set of frames containing surfaces, profiles extracted from surfaces, the results of applying filters and other operators, analytical studies and 2D and 3D parameters. A measurement identity card, screen notes and illustrations including bitmaps, text blocks, arrows and frames can be added to a document. New steps can be inserted into the analysis workflow at any time and existing steps can be modified, with automatic calculation of all dependent steps. All frames in a document can be exported to a bitmap file and calculated parameters can be exported to an Excel-compatible .csv file for interfacing with 3rd party software and systems. For easier integration into research and production, options for export of data in Word-compatible RTF format allow users to display data from parameters tables as actual tables.

Pico Image Expert

Pico Image Expert is a complete surface analysis package that contains all Pico Image Basic and Advanced features, plus several additional features.

Keysight AFMs and SPMs

The 9500 AFM seamlessly integrates revolutionary new Nanonavigator software, a new high-bandwidth digital controller, and a state-of-the-art mechanical design to provide unrivaled scan rates of 2 seconds/frame and truly astonishing ease of use. In addition to completely redefining the user experience for atomic force microscopes, this intelligently conceived system delivers the superior performance and flexible functionality that scientists and engineers have come to expect from Keysight. New NanoNavigator software, whose workflow-based graphical user interface (GUI) makes the system noticeably easy to use. The new software’s Auto Drive feature, for example, automatically and optimally sets parameters within seconds. The Keysight 9500 system offers a large, closed-loop AFM scanner with atomic resolution, industry-leading environmental control, ultra-high-precision temperature control. A new high-bandwidth, FPGA-based digital controller ensures high-speed operating precision and eliminates the requirement for additional external control boxes.

The 7500 AFM establishes new performance, functionality, and ease-of-use benchmarks for nanoscale measurement, characterization, and manipulation. This next generation system extends atomic force microscopy, offering a large, closed-loop AFM scanner with atomic resolution, industry-leading environmental control, ultra-high-precision temperature control, an unrivaled range of electrochemistry capabilities, and much more. The clever, compact design of the 7500 gives researchers quick, convenient access to their samples. A half-dozen of the most used AFM imaging modes are supported by the system’s standard nose cone, which can easily be interchanged with specialized nose cones as needed, extending the 7500’s capabilities effortlessly.

The 7500 inverted light microscope (ILM) system combines the power of the high-resolution 7500 AFM with the direct optical viewing capability of an ILM. The system offers unparalleled performance and ease of use for imaging in fluids. It extends AFM utility in order to encompass studies of single molecules, polymers, cell membranes, whole cells, and much more. Atomic force and optical fluorescence, FRET, darkfield and brightfield microscopy data can be obtained simultaneously.

Post Processing Pico Image Software for Keysight AFM Systems – Data The Keysight 5500 is an ideal multiple-user research system. The intelligent, modular design of this exceptional microscope permits the simple integration of numerous imaging modes and easy-to-use, application specific sample-handling plates. The 5500 sets the industry standard for environmental and temperature control, enabling leading-edge in situ experiments in air and liquid.

The Keysight 5500ILM adapter combines high-resolution AFM imaging with the direct optical viewing capability of an inverted light microscope to provide both atomic force and optical microscopy data. Its advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images.

The Keysight 5600LS utilizes a fully addressable 200mm x 200mm stage and a low-noise AFM design to perform high resolution imaging of large samples in air or smaller samples in liquid, and under temperature control. The programmable, motorized stage enables fast, accurate probe positioning for imaging and mapping large and small specimens alike.

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