Column Control DTX

Test-System Development Guide: Drivers and Direct I/O

Application Notes

This application note is part of the Test-System Development Guide series, which is designed to help you quickly design a test system that produces reliable results, meets your throughput requirements, and does so within your budget. This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument. It discusses how the driver came about, what the different software layers do in a system to help the instrument communicate to the PC, which drivers are compatible with various software languages and I/O software, and references for further study. See the list of additional application notes in the series on page 18.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX