Column Control DTX

Calibrating Signal Paths in RF/Microwave Test Systems

Application Notes

In any RF test system the ability to achieve instrument-port accuracy at the device under test (DUT) will enhance measurement accuracy and repeatability. Unfortunately, the non-ideal nature of the cables, components and switches in the paths between the instruments and the DUT can degrade measurement accuracy. Vector or scalar calibration is usually required to characterize and correct for this loss of accuracy.

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Column Control DTX