Column Control DTX

U7233A DDR1 Compliance Test Application with LPDDR and mobile-DDR Support

Data Sheets

Test, Debug and Characterize your DDR1 Designs Quickly and Easily

The Keysight Technologies, Inc. DDR1 compliance test application provides a fast and easy way to test, debug and characterize your DDR1 designs. The tests performed by the software are based on the JEDEC1 JESD79E Double Data Rate (DDR) SDRAM Specification and JESD209A Low Power Double Data Rate (LPDDR) SDRAM Specification. In addition, the application features Advanced Debug mode, which provides testing for embedded memory interfaces that do not operate according to the speeds specified by JEDEC. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis.

DDR1 is the first generation of a new breed of memory technology where data is transferred on both the rising and falling clock edges. DDR1 offers a significant performance advantage compared to previous memory technologies that were based on single data rates. As DDR1 manufacturing has matured, product costs have been driven down significantly, which has fueled growth, especially in the consumer product segment. DDR1 comes in two different packages, a fine ball-grid array (FBGA) package and a thin small-outline package (TSOP).

Signal integrity is crucial for memory system interoperability. Compliance to the JEDEC specification is the key to reliable and interoperable modular memory systems. Besides that, it ensures the memory system functions correctly and stays error free.

The U7233A DDR1 compliance test application is compatible with Keysight 9000 and 90000 Series Infiniium oscilloscopes.

Features

The DDR1 compliance test application offers several features to simplify the validation of your DDR1 designs:

  • New setup wizard for quick setup, configuration and test
  • Compliance testing of clock, electrical and timing measurements in accordance with the JEDEC JESD79E and JESD209A specifications
  • Comprehensive analysis that automates the complex measurements, even when you are not there
  • Unique read and write separation techniques with InfiniiScan “Zone Qualify” feature
  • Ability to separate and analyze the loading due to adjacent rank of the same memory channel
  • Automatically perform derating table calculations for setup and hold time measurements based on slew rate

Comprehensive Test Coverage

With the DDR1 compliance test application, you can use the same oscilloscope you use for everyday debugging to perform automated testing and margin analysis based on the JEDEC electrical and timing specifications. The application automatically configures the oscilloscope for each test and provides informative results. It includes margin analysis indicating how close your device comes to passing or failing the test for each specification.

Some of the difficulties in performing DDR1 tests are connecting to the target device, configuring the oscilloscope, performing the tests and analyzing the measured results. The DDR1 compliance test application does most of this work for you.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing DDR1 devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. On the environmental setup page, you can select the type of DDR1 devices, and the framework automatically filters the tests based on your selection. You can then select a category of tests or specify individual tests. The user interface is designed to minimize unnecessary reconnections, which saves time and minimizes potential operator error. You can save the tests and configurations as project files and recall them later for quick testing and review of previous results. Clear menus let you perform tests with a minimum of mouse clicks.

Configurability and Guided Connection

The DDR1 compliance test application provides flexibility in your test setup. The application lets you define controls for critical test parameters such as voltage threshold values, number of waveforms used for analysis and customizable violation settings. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected.

With the multiple test trial capability, you can extensively characterize the performance of your DDR1 devices. You can run the selected tests until the stop condition is met. The application will then save the worst-case conditions and help you track down the anomalies in your signals.

Comprehensive Results Analysis

In addition to providing you with measurement results, the DDR1 compliance test application reports how close you are to the specified limit. You can specify the level at which warnings are to be issued. You are provided with a full array of statistics for each measurement, and you can save worst‑case conditions to extensively test the performance of your device.

Thorough Performance Reporting

The DDR1 compliance test application generates thorough HTML reports that capture the performance, status and margins of your device. It also captures screen shots of critical measurements for your reference and documentation. This report is suitable for printing and sharing with your vendors, customers or colleagues.

Extensibility

You may add additional custom tests or steps to your application using the User Defined Application (UDA) development tool. Use UDA to develop functional “Add-Ins” that you can plug into your application.:

Add-ins may be designed as:

Complete custom tests (with configuration variables and connection prompts)

Any custom steps such as pre or post processing scripts, external instrument control and your own device control

Automation

You can completely automate execution of your application’s tests and Add-Ins from a separate PC using the included N5452A Remote Interface feature. You can even create and execute automation scripts right inside the application using a convenient built-in client.

The commands required for each task may be created using a command wizard or from “remote hints” accessible throughout the user interface.

Using automation, you can accelerate complex testing scenarios and even automate manual tasks such as:

  • Opening projects, executing tests and saving results
  • Executing tests repeatedly while changing configurations
  • Sending commands to external instruments
  • Executing tests out of order

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX