Column Control DTX

Phase Noise X-Series Measurement Application N9068A and W9068A

Technical Overviews

Introduction

  • One-button, easy-to-use, fast phase noise measurements with log plot and spot frequency views 
  • Spectrum and IQ waveform monitoring for quick signal checks in frequency or time domain 
  • Supports the X-Series signal analyzers with external mixing for carrier frequencies beyond 50 GHz 
  • Hardkey/softkey manual user interface or SCPI remote user interface 
  • Built-in, context-sensitive help 
  • Transportable licensing between X-Series signal analyzers or MXE EMI receiver

Phase Noise Measurement Application

In addition to a superior combination of speed, accuracy, flexibility, and dynamic range, the Keysight Technologies, Inc. X-Series signal analyzers offer the broadest set of measurement applications. The phase noise measurement application is an ideal tool for design verification and troubleshooting as well as production line testing. This application is built upon Keysight’s best-selling Option 226 phase noise measurement personality used in ESA and PSA spectrum analyzers and includes enhancements in measurement algorithms for optimized speed and dynamic range. 

The phase noise measurement application is just one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements, and software. The XSeries analyzers and MXE EMI receiver, with upgradeable CPU, memory, removable solid-state drive, and I/O ports, enable you to keep your test assets current and extend instrument longevity. Proven algorithms, 100% code-compatibility, and a common UI across the X-Series create a consistent measurement framework for signal analysis that ensures repeatable results and measurement integrity so you can leverage your test system software through all phases of product development. In addition to fixed, perpetual licenses for our X-Series measurement applications, we also offer transportable licenses which can increase the value of your investment by allowing to you transport the application to multiple X-Series analyzers. 

Phase Noise Measurement Overview

As wireless communication technologies evolve in the commercial and aerospace and defense industries, it is clear that the driver to meet demand for higher data rates, better spectrum efficiency, and lower power consumption is the digital technology, such as digital signal processing (DSP). It does not, however, devalue the importance of high-purity, highstability signals—signal stability is fundamental to successful modern digital wireless communication systems. Phase noise is still one of the most important characteristics when evaluating the short-term stability of a signal. Pressure to bring products to market more quickly than ever does not allow time for executing multiple measurements across several instruments. An accurate, fast, and easy-to-use phase noise measurement tool is critical in the R&D and manufacturing environments. A variety of measurement techniques have been developed to meet various requirements for phase noise measurements. The three most widely adopted techniques are: direct spectrum, phase detector, and twochannel cross-correlation. Among them, the direct spectrum technique is the simplest and perhaps oldest technique for making phase noise

measurements. Keysight’s X-Series phase noise measurement application is based on the direct spectrum technique. The most obvious advantage using the direct spectrum technique for phase noise measurements is that it can be realized with a general-purpose signal/ spectrum analyzer. However, the analyzer’s settings, such as resolution bandwidth (RBW) and internal phase noise optimization loops, will need to be adjusted based on offset frequency to achieve the highest measurement accuracy and speed. Manually implementing phase noise measurements with a signal analyzer can be tedious and time consuming. The X-Series phase noise measurement application automates the optimization processes for the signal analyzer settings with one-button measurements without user interference. 

With the X-Series signal analyzers or MXE EMI receiver and the phase noise measurement application, you can easily perform phase noise analysis on various devices, such as local oscillators and signal sources. The analysis includes: 

  • Log plot: Single-sideband (SSB) phase noise view in frequency domain 
  • Spot frequency: Phase noise view in time domain including carrier frequency drift measurement 
  • Monitor spectrum: Easy-to-use simple spectrum view for a quick check of your signal 
  • IQ waveform: Easy-to-use simple time domain view

Measurement details

Log plot phase noise

Log plot measures SSB phase noise (in dBc/Hz) versus offset frequencies expressed in logarithmic scale. This allows you to view the phase noise behavior of the signal under test across decades of offset frequencies.

View the entire phase noise behavior across a wide range of offset fre-quencies (1 Hz  to the difference between the maximum frequency of the analyzer and carrier frequency) and measure phase noise with a user-specified number of averages. Perform trace smoothing with user adjustable smoothing segment length. The log plot measurement function also includes:

  • AM rejection, which works for offsets equal to or less than 1 MHz so that you observe only the phase component
  • Overdrive function, which maximizes the dynamic range at offsets beyond 1 MHz, improving measurement accuracy by reducing the adverse effect of broadband noise
  • Support of maximum frequency up to 50 GHz and beyond (with PXA and external mixing) 
  • A suite of advanced marker functions optimized for detailed log plot trace analysis
  • Display of tabular readings (the decade table) in addition to the graphic presentation 
  • Automatic search of carrier function with Auto Tune Multi-level video filtering 

After a particular frequency offset has been identified for further analysis, the spot frequency measurement provides the time domain behavior of phase noise at that particular offset. 

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX