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Advanced Nanomeasurement Solutions

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Keysight Technologies meets your unique nanomeasurement requirements with a variety of flexible scientific-grade solutions 

Whether your application requires a high-resolution system that offers modularity and cross-platform compatibility for atomic force microscopy (AFM) and scanning probe microscopy (SPM), a nanoindenter or universal testing machine (UTM) optimized for high-precision nanomechanical characterization, or a compact, low-voltage system that delivers exceptional field emission scanning electron microscopy (FE-SEM) performance, Keysight Technologies, Inc. is committed to providing the right state-of-the-art instrumentation for your work. When you choose Keysight, you’re choosing a reliable partner with a long history of nanomeasurement innovation. Keysight was the first to offer SPM for imaging in fluids and controlled environments, a technological legacy that continues to manifest itself in a wide range of superior solutions for in-fluid and soft-sample imaging. We hold more than 40 AFM-related patents and our leading-edge R&D is committed to the pursuit of advancements that will make atomic force microscopy easier to use. More than 2,500 peer-reviewed papers have been published using Keysight AFM technology, further validating its high performance and versatility. The pedigree of our nanomechanical test instrumentation is equally impressive. For instance, the seminal paper authored by Warren Oliver and George Pharr has now surpassed 5,000 citations, making it the most frequently cited paper for nanomechanical properties of materials. Every Keysight nanomeasurement solution is backed by a team of knowledgeable application scientists and technical service personnel, all of whom strive to provide outstanding support to our customers around the world. We offer invaluable application expertise for life science, materials science, polymer science, electrochemistry, and cross-disciplinary nanoscale research. 

The Keysight Atomic Force Microscope Solutions Keysight 9500 AFM Series 

The 9500 AFM seamlessly integrates revolutionary new software, a new high-bandwidth digital controller, and a state-of-the-art mechanical design to provide unrivaled scan rates at 2 sec. per frame and truly astonishing ease of use. In addition to completely redefining the user experience for atomic force microscopes, this intelligently conceived system delivers the superior performance and flexible functionality that scientists and engineers have come to expect from Keysight Technologies. 

Advantages 

  • New NanoNavigator software with workflow-based GUI
  • Quick Scan for ultrafast scanning (100 lines/sec, 2 sec/frame)
  • Auto Drive automatically sets all parameters within seconds
  • Mobile app allows remote monitoring of system operation
  • New high-bandwidth digital controller ensures high-speed precision
  • 90 μm closed-loop scanner delivers atomic resolution Applications 
  • Materials science
  • Life science
  • Polymer science
  • Electrical characterization

Keysight 7500 AFM Series 

The Keysight 7500 AFM establishes new functionality, versatility, and ease-of-use benchmarks for nanoscale measurement, characterization, and manipulation. This next-generation system extends the forefront of atomic force microscopy, offering 90 μm closed-loop scanning atomic resolution, industry-leading environmental control, ultra-highprecision temperature control, an unrivaled range of electrochemistry capabilities, and much more. The clever, compact design of the 7500 gives researchers quick, convenient access to their samples. A half-dozen distinct AFM imaging modes are supported by the system’s standard nose cone, which can easily be interchanged with specialized nose cones as needed, extending capability effortlessly. 

Advantages 

  • Atomic scale imaging with closed loop 90 μm scanner
  • Exceptional environmental and temperature control
  • Superior scanning in fluids, gases, and ambient conditions
  • Single-pass nanoscale electrical characterization
  • Unprecedented electrochemistry (EC) capabilities
  • Standard nose cone supports expanded set of imaging modes

Applications 

  • Life science
  • Materials science
  • Polymer science
  • Electrochemistry
  • Nanolithography

Keysight 5500 AFM 

The Keysight 5500 is a powerful multiple-user research system for AFM. In addition to atomic-scale resolution, true modularity enables you to add capability-enhancing options as the need arises. An intelligent design permits the simple integration of numerous imaging modes and easy-to-use, application-specific sample-handling plates. Our balanced-pendulum, top-down multipurpose scanners — both open and closed loop — come in a range of sizes, all offering outstanding linearity and accuracy. 

Advantages 

  • The utmost flexibility from a highly modular system
  • Exceptional environmental and temperature control
  • Superior scanning in fluids, gases, or ambient conditions
  • High resolution over a large scan range
  • Convenient vertical sample approach

Applications 

  • Life science
  • Materials science
  • Polymer science
  • Electrochemistry
  • Nanolithography 

Keysight 5600LS AFM 

The versatile 5600LS is the world’s only commercially available AFM that allows high resolution imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM or STM scanner. Samples up to 8 inches in diameter and 30 mm tall are easily accepted by the 200 mm vacuum chuck. The 5600LS also accommodates a 300 mm vacuum chuck and a 2 inch multi-wafer vacuum chuck. 

Advantages 

  • Fully addressable and programmable 200 mm x 200 mm stage
  • Atomic-resolution imaging of small samples using an AFM or STM scanner
  • Simple point-and-shoot AFM imaging based on optical view
  • Accurate location mapping ensures reproducibility

Applications

  • Electronic materials
  • Semiconductor
  • Storage media
  • Materials science
  • Polymer science

Keysight 5500ILM AFM 

The ILM adapter combines high-resolution AFM imaging with the direct optical viewing capability of an inverted light microscope to provide both atomic force and optical microscopy data. Designed to allow the 5500 AFM to sit on top of an inverted microscope and under the top illumination pillar, the Keysight 5500ILM delivers excellent optical contrast in its images. It also enables a wide range of complementary techniques, such as fluorescence resonance energy transfer (FRET), darkfield, and brightfield imaging. 

Advantages 

  • Simultaneous AFM and optical (or fluorescence) imaging
  • Easy imaging in fluids via MAC Mode and sample plates
  • Design gives users open access to sample plates
  • Enhanced AFM flexibility through modular options

Applications

  • Life science
  • Polymer science
  • Nanobeads

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