Column Control DTX

Medalist i1000D In-Circuit Test System

Data Sheets

The Keysight Medalist i1000D In-Circuit Tester (ICT) redefines digital testing by bringing electronics manufacturers easy to use and affordable testing for digital devices.

The Keysight Technologies, Inc. Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.

With its new digital capabilities, the Medalist i1000D now can perform digital PCF/VCL library based testing, Boundary Scan and I2C/ SPI serial programming on a simple, low-cost long-wired test fixture. This presents an excellent opportunity for customers who are looking for better test coverage without any increase in cost.

The digital subsystem of the i1000D harnesses the simplicity and power from the industry-leading Medalist i3070 ICT, to bring customers the power to adjust test speeds, drive and receive voltages with just a few clicks of the mouse.

System Highlights

Ease of use

Retaining all the simple yet intuitive features of the earlier U9401/2A model, the new Medalist i1000D software adds on to its arsenal with new features that make development and debugging of digital tests as easy as ABC.

Following the development model of a typical Manufacturing Defects Analyzer, the user can now get a fixture and program up and running in just a few days. When digital test is required, simply assign the test libraries and power supplies using the new Developer GUI and let the i1000D software do the rest.

Simplified GUIs allow the user to quickly make changes to individual tests during debug, with a comprehensive set of menus and buttons, complete with AutoDebug features. This allows inexperienced users to start using the system quickly.

With the Medalist i1000D, unpowered passive analog components can be debugged with the click of a button, so even someone with limited ICT experience can perform a complete analog test debug in a matter of hours.

AutoDebug fine tunes tests so boards pass reliably in production. Statistical measures (CPK) are employed to determine the stability of the test. This automatic feature can reduce the normal debug process which takes days, to just a few hours.

Digital test are usually viewed as complex, difficult to understand and debug by many users. With the i1000D, things are different. The digital debug GUI leverages the control and flexibility of the legendary i3070 PushButton debug GUI, allowing engineers and technicians to have full control of the digital test parameters and test source codes, yet making it easy to understand. This is achieved by transforming lines of the complicated digital test source codes into simple, easy to understand graphical waveforms. Engineers and technicians performing debug are shielded from the massive lines of codes.

Fixturing

Long-wired MDA Press Down fixtures are not suitable for digital tests. Is this true or false?

While it is commonly perceived to be true, the Medalist i1000D proves this wrong.

The Medalist i1000D runs digital tests using a traditional MDA-style long-wired press down fixture. Boundary Scan tests, Serial Programming, Library-based tests all run without a glitch. Users now have a test solution that is simple and effective, and at the same time keep their operational costs down with the MDA-style fixtures.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX