Column Control DTX

Multi-Channel Parallel NBTI Testing Using EasyEXPERT Software

Application Notes

Keysight B1500A Semiconductor Device Analyzer

  • Parallel NBTI test improves test throughput
  • Controlled dynamic recovery with 100 μs accuracy
  • Full- scale resolution of 20,000 counts with 100 μs intervals assures accurate NBTI characterization

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Column Control DTX