Here’s the page we think you wanted. See search results instead:

 

Measuring wafer?

Explore turn-key solutions for your on-wafer measurements to save time and reduce risk.

Learn More

Learn More

Enhance your results

Engage with Keysight Services and find new ways to accelerate technology adoption and achieve lower costs.

Learn More

Learn More

Keysight acquires Anite

Acquisition enables Keysight to offer a complete solution for wireless device design and test needs across hardware and software layer.

Learn more

Learn more

Unlocking Measurement Insights

Master your 400G design

Master your 400G design

The M8040A is a highly integrated BERT for physical layer characterization and compliance testing. With data rates up to 64 Gbaud, it covers all flavors of 400 GbE standards.

More comprehensive analysis and connectivity: 89600 VSA software V.21

More comprehensive analysis and connectivity: 89600 VSA software V.21

  • More hardware connectivity
  • 16-channel vector analysis
  • DOCSIS 3.1 Upstream MER measurements
  • 2-channel pulse analysis
  • LTE-A/Custom OFDM enhancements
  • New/existing software user free trials

USB Type-C Design and Test

USB Type-C Design and Test

Tx, Rx, power delivery, alternate mode, simulation, cables - get from debug to characterization to compliance to done.

Breakthrough performance at a lower cost than most EW simulators

Breakthrough performance at a lower cost than most EW simulators

Quickly and accurately simulate realistic, dynamic radar threats, including angle of arrival, with the Multi-Emitter Scenario Generator Reference Solution.

Save 30% on power measurements

Save 30% on power measurements

Make better noise and ripple measurements on your DC power supplies with the low-noise Keysight solution: an S-Series oscilloscope, power rail probe and high-sensitivity current probe. Now 30% off!

Improve your system performance with USB preamplifiers

Improve your system performance with USB preamplifiers

The U7228A/C/F USB preamplifiers are designed to bring reliable gain and low noise figure to measurement systems improving the overall system performance and reducing systematic errors. Up to 50 GHz.