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SPECS User Training
Learn to quickly develop and run SPECS test plans to obtain semiconductor parametric information.

교육

Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

웹캐스트

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

웹캐스트 - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

웹캐스트 - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

웹캐스트 - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

웹캐스트 - recorded