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Accurate Modeling of Spiral Inductors on Silicon using Planar EM Simulation
RFIC Seminar (2004) presentation on Accurate Modeling of Spiral Inductors on Silicon from within Cadence Virtuoso using Planar EM Simulation.

Seminar Materials 2004-04-01

PDF PDF 1.28 MB
Acheiving Higher BW with Active Probes eSeminar FAQs
FAQs from the eSeminar

Seminar Materials 2006-05-10

PDF PDF 85 KB
Actionable_Information

Training Materials 2007-09-25

PDF PDF 2.41 MB
Active Channel Characterization Techniques for 5 Gb/s Designs and Higher
Presented by Bob Hasenick

Seminar Materials 2006-09-22

PDF PDF 4.43 MB
Address the challenges of testing low-voltage ICs
Address the challenges of testing low-voltage ICs

Webcast - recorded

Addressing Design and Test Challenges for the New LTE-Advanced Standard Webcast
Original broadcast July 15, 2014

Webcast - recorded

Addressing Measurement Challenges of 160 MHz 802.11ac MIMO
Original broadcast August 9, 2012

Webcast - recorded

Addressing Measurement Challenges of 160 MHz 802.11ac MIMO Webcast Slides
Slides from August 9, 2012 Webcast

Seminar Materials 2012-08-09

PDF PDF 1.08 MB
Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast
Live broadcast April 28, 2015; 10am PT / 1pm ET

Webcast

Addressing the Challenges of Complex Spectral Environment Simulation with Wideband Precision AWGs
Original broadcast July 30, 2014

Webcast - recorded

Adjusting NPLC and Aperture to make high speed measurements
To a great extent, a multimeter's reading speed is determined by the amount of time needed by the A/D converter.

Training Materials 2005-07-25

ADMF : De-Embedding and Equalization Using a Real-Time Oscilloscope
ADMF : Verify Your Signal Integrity Margins: De-Embedding and Equalization Using a Real-Time Oscilloscope

Seminar Materials 2009-08-25

PDF PDF 3.15 MB
ADMF : Getting the Most from Your Oscillocopes
ADMF : Getting the Most from Your Oscillocopes

Seminar Materials 2009-08-25

PDF PDF 4.11 MB
ADMF : HDMI1.3 Update and Logo Testing Update
ADMF : HDMI1.3 Update and Logo Testing Update

Seminar Materials 2009-08-25

PDF PDF 2.68 MB
ADMF : How to Measure Jitter Effectively
ADMF : How to Measure Jitter Effectively

Seminar Materials 2009-08-25

PDF PDF 3.92 MB
ADMF : Increase Your Test Capability with Scope-based Protocol Analysis
ADMF : Increase Your Test Capability with Scope-based Protocol Analysis

Seminar Materials 2009-08-25

PDF PDF 2.56 MB
ADMF2009: Protocol Compliance Performance Testing of DDR Error Injection Testing of PCIe
ADMF : Getting Know World's First Protocol Compliance/Performance Testing for DDR and Error Injection Testing of PCIe

Seminar Materials 2009-08-25

PDF PDF 3.60 MB
ADMF: 7 More Hints for Better Scope Probing
ADMF: 7 More Hints for Better Scope Probing

Seminar Materials 2009-08-25

PDF PDF 3.02 MB
ADMF: DisplayPort Compliance Test Challenges and Solutions
ADMF: DisplayPort Compliance Test Challenges and Solutions

Seminar Materials 2009-08-25

PDF PDF 2.01 MB
ADMF: Ensuring Interoperability and Performance of Your DDR Memory
ADMF: Ensuring Interoperability and Performance of Your DDR Memory

Seminar Materials 2009-08-25

PDF PDF 4.92 MB
ADMF: Facing the challenges of Super speed USB 3.0 Product Development
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development

Seminar Materials 2008-11-12

PDF PDF 1.78 MB
ADMF: Facing the challenges of Super speed USB Product Development
ADMF: Facing the challenges of Super speed USB Product Development

Seminar Materials 2009-08-25

PDF PDF 5.30 MB
ADMF: SATA Market and Technical Overview
ADMF: SATA Market and Technical Overview

Seminar Materials 2009-08-25

PDF PDF 2.36 MB
ADMF: Transforming of Mobile Device Design with Digital Wireless Standards
ADMF: Transforming of Mobile Device Design with Digital Wireless Standards

Seminar Materials 2009-08-25

PDF PDF 3.58 MB
Adobe, .pdf file of April 2009 WebEX presentation, New Ultra-Fast Noise Parameter System
Adobe, .pdf file of April 2009 WebEX presentation, New Ultra-Fast Noise Parameter System

Seminar Materials 2009-04-17

PDF PDF 1.03 MB

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