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Evénements Keysight en France
Bienvenue sur la page des événements auxquels participe Keysight en France

Seminar

1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast

1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices.
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast - recorded

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Automating Semiconductor and Power Semiconductor Device Testing Webcast
Original broadcast June 24, 2015

Webcast - recorded

Electronic Measurement Events in Europe, Middle East & Africa
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

Webcast - recorded

Fundamentals of Low Current and Ultra-High Resistance Measurement Webcast
Original broadcast April 14, 2015

Webcast - recorded

Fundamentals of Wavelength Dependent Optical Component Testing Webcast
Live broadcast September 29, 2015; 10am PT / 1pm ET

Webcast

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Keysight's live webcasts
Stay up to date by bookmarking this page to see the latest information on Keysight's webcasts.

Webcast

Measuring Complex Materials and their Components Seminar 2013
Keysight will provide a FREE all day seminar including impedance measurements fundamentals, characterizing complex materials, measuring material properties in nano-scale resolutionand discuss emerging novel materials research-challenges and solutions.

Seminar

Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

New Techniques and Methods to Evaluate Power Device Switching Loss Webcast
Original broadcast Ocotber 14, 2014

Webcast - recorded

Non-destructive testing of powders, ceramic, oils, & other composite materials
Original broadcast December 11, 2014

Webcast - recorded

Optimizing Battery Run and Charge Times of Today’s Mobile Wireless Devices Webcast
Original broadcast June 18, 2015

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

Successfully Make Power and AC Line Disturbance Measurements Webcast
Original broadcast June 25, 2015

Webcast - recorded

Wide Bandgap (GaN & SiC) Power Semiconductor Device Measurements
Learn how to make real time IV measurements on Power Devices at upto 1.5kA and upto 10kV. The Webcast also includes GaN current collapse measurements which are essential for device development and manufacturing process optimisation.

Webcast