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Improve Your Data Acquisition IQ!
Original broadcast October 19, 2016

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Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

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International Microwave Symposium (IMS) 2016
May 22-27, 2016; San Francisco, CA

展览会

5G Channel Sounding Challenges and Test Approaches Webcast
Original broadcast September 24, 2015

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Addressing Challenging New Test Requirements for DOCSIS 3.1 Upstream Signals Webcast
Original broadcast August 12, 2015

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Test & Measurement Trends for Aerospace and Defense Webcast
Original broadcast July 23, 2015

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Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast
Original broadcast April 28, 2015

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Testing upstream and downstream DOCSIS 3.1 Devices Webcast
Original broadcast April 14, 2015

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Bridging the Gap from Benchtop to PXI: A Common Software Strategy Webcast
Original broadcast March 26, 2015

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One Size Does Not Fit All - Choose the Right Instrument Form Factor Webcast
Original broadcast March 11, 2015

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Non-destructive testing of powders, ceramic, oils, & other composite materials
Original broadcast December 11, 2014

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E-Band Wireless Backhaul: System Design & Test Challenges Webcast
Original broadcast March 27, 2014

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Get in the Zone – The Nyquist Zone
Original broadcast July 10, 2014

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Addressing the Challenges of Complex Spectral Environment Simulation with Wideband Precision AWGs
Original broadcast July 30, 2014

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DOCSIS 3.1 Signal Generation and Analysis Solution Webcast
Original broadcast June 25, 2014

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Next Generation 802.11ac WLAN MIMO Design & Test Challenges
Original broadcast May 10, 2012

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Addressing Measurement Challenges of 160 MHz 802.11ac MIMO
Original broadcast August 9, 2012

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Multi-antenna Array Measurements Using Digitizers Webcast
Original broadcast May 29, 2013

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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Digitizer fundamentals: Design considerations to achieve superior measurements
More than just understanding banner specs such as bandwidth and sampling rate, this webinar will arm you with knowledge of digitizer technology and underlying specifications to ensure you make accurate measurements that meet your application needs.

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全部网络研讨会点播和录像
Access the free, On-Demand (recorded) webcasts

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