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AFM/SPM Accessories - Brochure

手册 2016-03-24

PDF PDF 5.34 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

应用说明 2016-03-11

PDF PDF 7.96 MB
9500 AFM - Data Sheet
Data sheet for the new 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

产品资料 2015-11-24

PDF PDF 2.83 MB
是德科技使用 B2985A/87A 进行绝缘材料电阻率的测量
是德科技使用 B2985A/87A 进行绝缘材料电阻率的测量

应用说明 2015-10-28

Nanoindentation of a Multiphase Composite with NanoVision - Application Note
Review of Nanoindetation of a multicomposite using Nanovision

应用说明 2015-08-28

PDF PDF 176 KB
T150 UTM - Data Sheet
Overview of features & benefits of the T150 with specifications

产品资料 2015-07-31

PDF PDF 1000 KB
Keysight 7500 AFM Demo Video
This is a series of 8 informational AFM videos that takes the viewer from basic set-up of the instrument through modes to post-processing of your images.

视频演示 2015-07-28

Keysight AFM 9500 Demo Video
Keysight AFM 9500 Demo Video

基本演示 2015-07-23

8500B Field-Emission Scanning Electron Microscope - Data Sheet
Features, benefits and specifications for the 8500B FE-SEM

产品资料 2015-05-22

PDF PDF 1.78 MB
8500 FE-SEM System - Brochure

手册 2015-05-19

PDF PDF 1.19 MB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

应用说明 2015-05-04

PDF PDF 343 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

应用说明 2015-05-04

PDF PDF 624 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

应用说明 2015-05-03

PDF PDF 1.38 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

应用说明 2015-04-30

PDF PDF 521 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

应用说明 2015-04-30

PDF PDF 552 KB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

应用说明 2015-04-30

PDF PDF 2.75 MB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

应用说明 2015-04-28

PDF PDF 4.95 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

应用说明 2015-04-28

PDF PDF 967 KB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

应用说明 2015-04-28

PDF PDF 2.67 MB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

应用说明 2015-04-10

PDF PDF 2.99 MB
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

应用说明 2015-04-10

PDF PDF 2.90 MB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology/History of Art - App Note

应用说明 2015-04-08

PDF PDF 6.94 MB
Nanomeasurement Instruments for Industry R&D - Brochure
This brochure discusses nanomeasurement instruments for industry R&D.

手册 2015-04-08

PDF PDF 1.53 MB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

应用说明 2015-03-23

PDF PDF 5.80 MB
7500 STM Scanner - Data Sheet

产品资料 2015-03-23

PDF PDF 104 KB

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