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Electronic Design Automation Software

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System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

Article 2014-04-02

ADS 2014 Help
Product-specific release information for Advanced Design System 20114

Help File 2014-03-20

ADS 2014.01 Release Notes
Information about the ADS 2014.01 Release

Release Notes 2014-03-20

Discovering ADS
A collection of Keysight EEsof EDA ADS video demonstrations and tutorials

Demo 2014-03-20

Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Press Materials 2014-03-13

EMPro 3D EM Simulation Platform Support Roadmap
Keysight EEsof EDA EMPro 3D EM Simulation platform support roadmap

Selection Guide 2014-03-06

PDF PDF 100 KB
ADS 30-Second Demos
Watch these videos to learn about popular usability improvements we’ve made in Advanced Design System (ADS) to increase your productivity.

Demo 2014-03-06

Agilent Technologies Unveils New 30-Second Demo Series of User-Inspired ADS 2014 Innovations
Agilent announces the launch of a new series of 30-second demos on user-inspired innovations to its Advanced Design System 2014 software, the industry’s leading electronic design automation software for RF, microwave and signal-integrity applications.

Press Materials 2014-03-06

Overcoming the Challenges of Simulating Phased-Array Radar Systems
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Application Note 2014-02-26

Agilent Software Gives Students Edge in Job Market
Design tools are getting University of Arizona engineering students certifiably ready for work in the RF and microwave industry.

Press Materials 2014-02-24

ADS 2014 Dramatically Improves Design Productivity and Efficiency
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

Press Materials 2014-02-11

Sanjay Gangal of EDACafé interviews Colin Warwick on New SI and EM Products at Designcon 2014
Sanjay Gangal, V.P. Sales & Marketing at EDACafé interviews Colin Warwick, Product Manager at Keysight Technologies, at Designcon 2014, .

Demo 2014-02-04

Agilent Technologies’ LinkedIn ADS User Group Tops 3,000 Members
Agilent announces that the Agilent EEsof EDA Advanced Design System (ADS) user group on LinkedIn now has over 3,000 members.

Press Materials 2014-02-03

ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

Overcoming the Challenges of Designing and Testing Phased-Array Radar Systems
Microwave Product Digest (MPD) featured article for January 2014 written by Dingqing Lu of Agilent Technologies.

Article 2014-01-27

W2307EP/ET Controlled-Impedance Line Designer (CILD)
The W2307EP Controlled-Impedance Line Designer enables you to optimize your PCB stack up and transmission line geometry using metrics that matter, namely post-equalizer eye diagram parameters.

Data Sheet 2014-01-23

GoldenGate Software Release Brings Wireless Standard-Compliant Design into RFIC Designers’ Hands
Agilent announces the latest release of GoldenGate, its RFIC simulation, verification and analysis software.

Press Materials 2014-01-06

MBP and MQA Adopted by Microchip Technology for PDK Creation, Modification, Validation
Agilent Technologies announces that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA's Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design kits, modify external foundry libraries, and validate supported devices from internal and external sources.

Press Materials 2013-12-09

Using Channel Coding to Verify and Increase the Performance of Channel-Coding Algorithms
An advanced simulation methodology and environment can now be used to verify and measure the efficiency of algorithms under real-world communication scenarios, saving engineers both significant time and cost.

Article 2013-12-09

3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
APPLIED PHYSICS LETTERS 103, 213106 (2013) - A theoretical analysis and numerical validation of a calibration algorithm for scanning microwave microscopy (SMM) imaging at the nanoscale.

Application Note 2013-11-19

3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
APPLIED PHYSICS LETTERS 103, 213106 (2013) - A theoretical analysis and numerical validation of a calibration algorithm for scanning microwave microscopy (SMM) imaging at the nanoscale.

Article 2013-11-19

PDF PDF 1.52 MB
A New Approach for Multi-Emitter Test Signal Generation
A new capture and playback approach generates multi-emitter test signals using a combination of COTS test equipment and simulation software.

Article 2013-11-14

Creating Multi-Emitter Signal Scenarios with COTS Software and Instrumentation – Solution Brief
Describes a key problem, describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-11-12

PDF PDF 1017 KB

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