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N7785B Synchronous Scrambler - Data Sheet
This data sheet explains the N7785B and that it is a high-speed synchronous scrambler. It contains a polarization controller plus microcontroller- based driving circuitry.

Data Sheet 2014-08-03

PDF PDF 456 KB
N7744A/N7745A Optical Multiport Power Meter - Data Sheet
Data sheet of Keysight's new LXI compliant N7744A and N7745A optical power meter with four or eight power-sensor channels

Data Sheet 2014-08-03

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

N7747A and N7748A High-Sensitivity Optical Power Meter - Data Sheet
The 2-port N7747A and 4-port N7748A bring the high performance of the 81634B to the compact N77 platform, offering 100X more memory, faster data transfer rates, and continuous logging.

Data Sheet 2014-08-03

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

PDF PDF 1.94 MB
All-states measurement method for PDL and PER with a synchronous polarization scrambler
This synchronized all-states PDL method using the Keysight N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results.

Application Note 2014-08-02

PDF PDF 590 KB
Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2014-08-02

PDF PDF 724 KB
81490A Reference Transmitter - Data Sheet
Keysight's 81490A Reference Transmitter is designed to offer excellent eye quality as a reference for testing 10GbE -LR/ -ER, 10G Fibre Channel 10GBase-SR, 40GBase-SR4, and 100GBase-SR10.

Data Sheet 2014-08-02

PDF PDF 523 KB
86122C Multi-Wavelength Meter Getting Started Guide
86122C Multi-Wavelength Meter Getting Started Guide

Quick Start Guide 2014-08-01

PDF PDF 1.61 MB
N1010A FlexDCA Virtual Device Demonstration
This 3-minute video shows how the Keysight N1010A FlexDCA software can help semiconductor companies sell high-speed semiconductors

Demo 2014-08-01

86122C Multi-Wavelength Meter User's Guide
86122C Multi-Wavelength Meter User's Guide

User Manual 2014-08-01

PDF PDF 2.71 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

N5392A Ethernet Electrical Performance Validation and Compliance Software - Data Sheet
The Keysight Technologies N5392A Ethernet electrical performance validation and compliance software for Infiniium 54830 and 54850 Series oscilloscopes provides you with a fast and easy way to verify and debug your 1000Base-T, 100Base-TX and 10Base-T Ethernet designs. The Ethernet electrical test software

Data Sheet 2014-08-01

81595B Modular Optical Switches - Data Sheet
Keysight 81591B / 4B / 5B Modular Optical Switches - Technical Specifications

Data Sheet 2014-07-31

PDF PDF 362 KB
Does your TLS have specifications pertinent to swept measurements? - Techincal Overview
This technical note describes the parameters given in the specifications of the TLS that are pertinent to dynamic conditions (that is, swept measurements).

Application Note 2014-07-31

PDF PDF 252 KB
Photonic Foundation Library Fast Sweep PDL - Application Note
This application note describes an approach to significantly reduce the measurement time associated with polarization dependent loss (PDL) measurements.

Application Note 2014-07-31

PDF PDF 680 KB
3.35 GHz Pulse/ Pattern Generators - Promotional Flyer
The 81133a/34a is the first choice when timing and performance are vital. It is designed to enable R&D and test engineers to carry out tests more effectively, by providing access to necessary parameters.

Promotional Materials 2014-07-31

PDF PDF 1.31 MB
15431A Filter Set for 81150A - Data Sheet
The Agilent 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers. To be used in conjunction with the N4903A.

Data Sheet 2014-07-31

PDF PDF 1.09 MB
Keysight L4610A PRM - 34B Radio Test Set - Brochure
Rugged, portable, radio test set provides true one-button operational testing of SINCGARS radios

Brochure 2014-07-31

PDF PDF 1.53 MB
Photonic Foundation Library: Enhancing Swept Loss Measurements - Application Note
This application note describes the measurement functionality and the accuracy enhancements enabled by the know-how contained in the Photonic Foundation Library.

Application Note 2014-07-31

PDF PDF 3.90 MB
State of the Art Characterization of Optical Components for DWDM Applications
Fiber optic network technology is taking a big step forward with the tremendous transmission capacity offered by dense wavelength-division multiplexing (DWDM).

Application Note 2014-07-31

PDL Measurements Using the Keysight 8169A Polarization Controller
This product note discusses the polarization dependent loss (PDL) measurement process; in particular using the 8169APolarization controller.

Application Note 2014-07-31

PDF PDF 726 KB
8169A Polarization Controller - Data Sheet
This product overview contains information and specifications about the 8169A polarization controller as an important building block of an optical test system.

Data Sheet 2014-07-31

PDF PDF 764 KB
USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2014-07-31

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