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Photonic Test & Measurement Products

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201-225 of 677

Keysight M8195A AWG within the Mobile & Network Ecosystem
As devices and interfaces become faster and more complex, the M8195A AWG gives you the versatility to create the signals you need for digital applications, optical and electrical communication, advanced research, wideband radar and satcom.

Demo 2014-09-08

Keysight M8195A AWG - The Digital and Arbitrary Signal Generator
Keysight M8195A AWG - The digital and arbitrary signal generator with the highest combination of speed, bandwidth and channel density The M8195A AWG is a high speed AWG with up to 65 GSa/s sample rate and 20 GHz bandwidth on up to 4 channels per module.

Demo 2014-09-08

N4962A Serial BERT 12.5 Gb/s - Data Sheet
The N4962A is a low cost 0.5 to 12.5 Gb/s pseudo-random bit sequence generator and bit error rate tester designed for automated production-line testing, manufacturing, and R&D use.

Data Sheet 2014-08-25

High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-08-04

N7786B Polarization Synthesizer - Data Sheet
This data sheet describes the N7786B Polarization Synthesizer. The N7786B contains a high-speed Lithium-Niobate based polarization controller and a polarization analyzer plus a microcontroller-based driving circuitry.

Data Sheet 2014-08-03

Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

N7784B High Speed Polarization Controller - Data Sheet
This data sheet describes the polarization controller, that contains a high-speed polarization controller plus microcontroller-based driving circuitry. This unit can operate in various modes.

Data Sheet 2014-08-03

N77-Series Attenuators - Data Sheet
The Keysight N775xA and N776xA series single and multimode optical attenuators provide fast stable power setting with built-in power monitoring for optical transceiver and network integration test

Data Sheet 2014-08-03

N7747A and N7748A High-Sensitivity Optical Power Meter - Data Sheet
The 2-port N7747A and 4-port N7748A bring the high performance of the 81634B to the compact N77 platform, offering 100X more memory, faster data transfer rates, and continuous logging.

Data Sheet 2014-08-03

N7785B Synchronous Scrambler - Data Sheet
This data sheet explains the N7785B and that it is a high-speed synchronous scrambler. It contains a polarization controller plus microcontroller- based driving circuitry.

Data Sheet 2014-08-03

N7781B Polarization Analyzer - Data Sheet
The Keysight N7781A is a compact high-speed polarization analyzer that provides comprehensive capabilities for analyzing polarization properties of optical signals.

Data Sheet 2014-08-03

N7744A/N7745A Optical Multiport Power Meter - Data Sheet
Data sheet of Keysight's new LXI compliant N7744A and N7745A optical power meter with four or eight power-sensor channels

Data Sheet 2014-08-03

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

N77-Series Optical Switches - Data Sheet
The Keysight N77-series optical switches support efficient automation of fiber-optic test setups with excellent repeatability and multimode fidelity.

Data Sheet 2014-08-03

All-states measurement method for PDL and PER with a synchronous polarization scrambler
This synchronized all-states PDL method using the Keysight N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results.

Application Note 2014-08-02

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

81490A Reference Transmitter - Data Sheet
Keysight's 81490A Reference Transmitter is designed to offer excellent eye quality as a reference for testing 10GbE -LR/ -ER, 10G Fibre Channel 10GBase-SR, 40GBase-SR4, and 100GBase-SR10.

Data Sheet 2014-08-02

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2014-08-02

86122C Multi-Wavelength Meter User's Guide
86122C Multi-Wavelength Meter User's Guide

User Manual 2014-08-01

86122C Multi-Wavelength Meter Getting Started Guide
86122C Multi-Wavelength Meter Getting Started Guide

Quick Start Guide 2014-08-01

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

N1010A FlexDCA Virtual Device Demonstration
This 3-minute video shows how the Keysight N1010A FlexDCA software can help semiconductor companies sell high-speed semiconductors

Demo 2014-08-01

N5392A Ethernet Electrical Performance Validation and Compliance Software - Data Sheet
The Keysight Technologies N5392A Ethernet electrical performance validation and compliance software for Infiniium 54830 and 54850 Series oscilloscopes provides you with a fast and easy way to verify and debug your 1000Base-T, 100Base-TX and 10Base-T Ethernet designs. The Ethernet electrical test software

Data Sheet 2014-08-01

Does your TLS have specifications pertinent to swept measurements? - Techincal Overview
This technical note describes the parameters given in the specifications of the TLS that are pertinent to dynamic conditions (that is, swept measurements).

Application Note 2014-07-31

On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2014-07-31

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