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How to Test USB Type-C Alt Mode and the Standards Running Across It - Application Note
This application note discusses how Alt mode works with power delivery circuitry to transmit/receive unique data signals/more power, so Type-C can be used for many USB & non-USB, device connections/control.

Application Note 2016-04-29

PDF PDF 1.72 MB
Massive Parallelism Production Test Reference Solution - Configuration Guide
EXM resource manager library created for the Massive Parallelism Production Test Reference Solution. This functionality provides API functions for chipset automation test tools.

Configuration Guide 2016-04-28

PDF PDF 604 KB
PNA Family Microwave Network Analyzers - Configuration Guide
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the PNA Family microwave network analyzers.

Configuration Guide 2016-04-27

How to Test USB Power Delivery (PD) Over Type-C - Application Note
USB Type-C power delivery creates possibilities for USB connected devices with higher, bi-directional power and power for non-USB devices with ALT mode. Learn more about verification/compliance.

Application Note 2016-04-26

PDF PDF 2.50 MB
E7515A UXM Wireless Test Set - Brochure
The UXM is a highly-integrated signaling test set for functional and RF design validation in the 4G era and beyond, so you can assess design readiness with greater confidence and make a clear call.

Brochure 2016-04-26

PDF PDF 11.37 MB
L Series Multiport Electromechanical Coaxial Switches - Technical Overview
This technical overview of the economically-priced L7104A/BC and L7106A/B/C terminated and L7204A/BC and L7206A/B/C unterminated multiport coaxial switches, DC to 26.5 GHz, provides a product overview, description, applications, specifications and ordering information.

Technical Overview 2016-04-26

InfiniiVision 3000 X-Series Oscilloscopes - Data Sheet
Keysight's award-winning InfiniiVision X-Series oscilloscopes give you breakthrough technology that delivers more scope for the same budget.

Data Sheet 2016-04-25

Magnetic Force Microscopy Using the 9500 AFM - Application Note
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy mode that enables researchers to probe the magnetic properties of a material. This note explores the characterization of magnetic samples.

Application Note 2016-04-25

PDF PDF 2.08 MB
81663A DFB Laser, 8165xA Fabry-Perot Lasers - Data Sheet
The Keysight 81663A and 8165xA high power DFB Laser Source Modules are best suited for optical amplifier test and DWDM system test applications.

Data Sheet 2016-04-24

PDF PDF 863 KB
Optical Power Meter Head Special Calibration - Brochure
This document describes the calibration of Keysight's optical power heads and the optional special working standard calibration.

Data Sheet 2016-04-24

PDF PDF 928 KB
DSO1000A/B Series Portable Oscilloscopes - Data Sheet
Keysight’s new 1000 Series oscilloscopes deliver the performance and features you expect in a big scope – and the portability and low price you require in a small one.

Data Sheet 2016-04-22

E7515A UXM Wireless Test Set - Brochure
The UXM is a highly integrated signaling test set created for functional & RF design validation in the 4G era & beyond. It delivers LTE-A cat 6 now & will handle increasingly complex cases later.

Brochure 2016-04-22

PDF PDF 1.53 MB
N2870A-Series and N2894A Passive Probes User's Guide
This manual contains user information for the N2870A Series and N2894A passive probes.

User Manual 2016-04-21

PDF PDF 1.14 MB
81602A Extra High Power Tunable Laser - video
The Keysight 81602A is an extra high power tunable laser operating from 1250 nm to 1370 nm. With over +17 dBm peak power and +16 dBm in the 100GBASE-LR4 range, it improves tolerance for optical power budgets in test setups.

Demo 2016-04-20

Small Cell Test, Reference Solution - Solution Brochure
Keysight's small-cell test, reference solution provides sample test plans, instrumentation and DUT control, simplifying test development and optimizing test throughput.

Brochure 2016-04-20

PDF PDF 1.37 MB
E6966B IMS-SIP Network Emulator - Technical Overview
The E6966B IMS-SIP network emulator allows you to efficiently test the performance and functionality of cellular user equipment in an all-IP IMS-SIP environment.

Technical Overview 2016-04-19

M8197A Synchronization Module for M8195A – User’s Guide
The M8197A synchronization module for up to 4 M8195A arbitrary waveform generator modules enables a fully synchronous, phase coherent multi-channel generator system with up to 16 analog channels.

User Manual 2016-04-19

1000 Series Oscilloscopes - Product Fact Sheet
Industry comparison between the Keysight DSO1000B Oscilloscope and the Tektronix TDS1000C-EDU Oscilloscope.

Brochure 2016-04-18

PDF PDF 587 KB
InfiniiVision Oscilloscope Probes and Accessories - Selection Guide
The right probes and accessories for your particular application--The 54600-series scopes combine three critical features; 2 MB of MegaZoom deep memory on each channel, are volutionary high-definition display, and flexible triggering CAN triggering. This combination of capabilities is tailored togive you the measurement power you need to get your mixed analog and digital job done faster.

Selection Guide 2016-04-18

Probes and Accessories for Keysight Oscilloscopes – Selection Guide
Probes and accessories for Keysight oscilloscopes, Reliable measurements start with the probe. Active differential probes, single-ended active probes, Passive probes, Current probes.

Selection Guide 2016-04-18

Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-04-15

N5413B and N5413C DDR2 and LPDDR2 Compliance Test Application – Data Sheet
The N5413B DDR2 and LPDDR2 compliance test application provides a fast and easy way to test, debug and characterize your DDR2 and LPDDR2 designs.

Data Sheet 2016-04-15

T3100S Series NFC Test Systems - Technical Overview
This technical overview shows the elements and specifications that create the T3100S Series Test Systems for NFC testing during product development, R&D, pre-conformance and final certification.

Technical Overview 2016-04-13

VoLTE Battery Test, Reference Solution - Configuration Guide
The VoLTE battery test reference solution implements battery performance test plan and output results to a required test report.

Configuration Guide 2016-04-12

PDF PDF 1.74 MB
Integration of the UXM Wireless Test Set in Bluetest's RTS65 Reverberation Test System

Press Materials 2016-04-11

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