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Keysight Technologies Introduces Signal Generation Support for LTE/LTE-Advanced Uplink 2x2 MIMO
Press releases highlighting the N7624B and N7625B Signal Studio

Press Materials 2014-08-08

Keysight Technologies Introduces Signal Generation Solution for IEEE 802.15.4g-Based Wi-SUN
Press releases highlighting the N7610B Signal Studio for IEEE 802.15.4g

Press Materials 2014-08-08

UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development
UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development

Press Materials 2014-08-04

Keysight Technologies Begins Operations
Keysight Technologies, Inc. announces the electronic measurement business of Agilent Technologies has begun operating under the Keysight name.

Press Materials 2014-08-01

Keysight Technologies to Showcase Products, Present Technical Papers at EMC 2014
Keysight announces that it will demonstrate some of its focused products at EMC 2014, the IEEE International Symposium on Electromagnetic Compatibility, Raleigh Convention Center, Booth 323, Raleigh, North Carolina, Aug. 5-7.

Press Materials 2014-08-01

No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

Press Materials 2014-07-28

Industry's most accurate test solution for USB 3.1 receivers – press release
Using the USB 3.1 receiver test set, design and test engineers in the semiconductor and computer industry can now accurately characterize and verify USB 3.1 receiver ports in ASICs and chipsets.

Press Materials 2014-07-09

ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

Agilent Technologies Introduces Family of Basic AC Power Sources for Reliable Testing
A new family of basic AC power sources that deliver reliable power for design and manufacturing. The new Agilent AC6800 Series includes four models from 500 VA to 4000 VA output power, all with the quality and capability required for basic testing.

Press Materials 2014-06-24

Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Press Materials 2014-06-18

Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer. The new modeling and simulation capability reduces development time for research and design validation teams working on early system prototyping and development of advanced multichannel applications.

Press Materials 2014-06-17

Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Press Materials 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Press Materials 2014-06-12

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Press Materials 2014-06-02

Certification of HDMI 2.0 6G Test Solution for HDMI 2.0 Compliance Test - press release
2.0 6G test solution provides the widest coverage for HDMI physical layer compliance test. Certification was achieved using the collaborative framework of Simplay Labs Authorized Test Centers, the world's leading HD testing service provider, with locations in Sunnyvale, California; Beijing, Shanghai and Shenzhen, China; and Seoul, Korea.

Press Materials 2014-05-30

Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

New Modeling, Verification Platform for Radar, Electronic Warfare
Moving Scenarios, Beamforming Accelerate Radar System Design and Validation.

Press Materials 2014-05-21

Agilent Technologies Announces 4x4 True MIMO Evolution on EXM Wireless Test Set

Press Materials 2014-05-21

Automatic Fixture Removal Option Enables Industry's Fastest, Easiest Non-Coaxial Device Measurement

Press Materials 2014-05-20

Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Press Materials 2014-05-08

Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Press Materials 2014-04-30

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