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정렬방식:
5G air interfaces need channel measurements
EDN, Oct 31, 2015 article by Sheri DeTomasi discusses characterizing the radio channel to understand how the new 5G signals will propagate and describes a system that will provide the needed insights.

기사 2015-10-31

Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

특집 기사 2015-10-28

5G set to dramatically impact test and measurement
Canadian electronics, Oct 19, 2015 article by Roger Nichols discusses the challenges of testing in the investigations of the different 5G technologies.

기사 2015-10-19

교정을 사용하여 중요한 측정의 성능을 최적화 – 기사 재인쇄
재인쇄된 이번 기사는 두 가지 목표를 다루고 있습니다. 하나는 고객이 기대하는 (그리고 고객에게 당연히 제공되어야 하는) 측정을 얻을 수 있도록 지원하는 것이고 다른 하나는 고객이 혁신적인 교정을 활용해 효과적인 측정 성능을 개선할 수 있도록 지원하는 것입니다.

기사 2015-10-01

PDF PDF 253 KB
Wireless Power Transfer Efficiency Test with ENA Series Network Analyzers
Option 006 wireless power transfer analysis software in ENA Series network analyzers enable wireless power transfer efficiency measurements in real-time. Advanced 2D/3D simulation feature visualizes the dependency of load impedance.

기사 2015-09-27

Keysight EEsof EDA makes it easy to get back to school—at least virtually
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

기사 2015-09-11

First 50 GHz Handheld Analyzer Speeds Field Work - Article Reprint
This MW Journal article reprint describes the new family of FieldFox analyzers - the industry's first 50 GHz handheld models, including how they can be effectively used in radar and satellite apps.

기사 2015-09-01

PDF PDF 1.24 MB
The Universal Flash Storage Association (UFSA)
UFSA

뉴스레터 2015-08-18

IEEE 802.11ah: Wi-Fi below 1 GHz
EDN, August 17, 2015 article by Kevin Qian & Mingyan Wang explains the new IEEE 802.11ah technology for IoT and the test challenges.

기사 2015-08-17

Modular Tester Performs 5G Channel Sounding
The 5G Channel Sounding Reference Solution test system features compact instrument modules and multiple software packages to generate and analyze complex waveforms for characterizing 5G wireless communications channels.

기사 2015-08-04

Challenges extend from simulation to compliance
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

기사 2015-07-08

위상 노이즈, 진폭 및 TOI 측정 에러 - 기사 재인쇄(영어)
이 기사는 3가지 주요 측정을 이용해서 계측기를 장비의 원래 데이터 시트 사양과 정기적으로 비교해야 하는 필요성에 대해 설명합니다.

기사 2015-06-11

PDF PDF 675 KB
Phase Noise, Amplitude and TOI Measurement Errors - Article Reprint
This article uses three key measurements to illustrate the need to periodically compare the performance of your instrument with the equipment's original data sheet specifications.

기사 2015-06-11

PDF PDF 675 KB
Determining the Best RF Simulation Tools as an RF Consulting Engineer
Independent consulting in RF and microwave engineering is a growing trend and many engineers are delivering their highly sought after RF expertise back to the industry.

기사 2015-06-08

PDF PDF 2.64 MB
A Bead Probe CAD Strategy for In-Circuit Test - White Paper
IEEE article reprint discussing the potential of using bead probes in computer aided design (CAD) systems when getting a board ready for production.

기사 2015-06-08

PDF PDF 1.46 MB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

기사 2015-06-08

PDF PDF 1.86 MB
Radar, Electronic Warfare, and Electronic Intelligence Testing: Identifying Common Test Challenges
This article reprint from Defense Technical Briefs covers common test challenges and radar basics. Radar, EW, and ELINT engineers make a variety of routine measurements. As highlighted earlier, pulse width and PRF or PRI provide important information about a radar system’s resolution and range.

기사 2015-06-08

PDF PDF 5.40 MB
Faster Testing with High-Performance Spectrum Analysis in a VNA - Article Reprint
Article reprint from the June 2015 issue of Microwave Journal highlighting the new spectrum analyzer option for the PNA Series.

기사 2015-06-01

PDF PDF 1.23 MB
The key to early 5G investigation – test tools for new network paradigms
Electronic Products and Technology, May 2015 article discusses the needs of 5G, areas of investigations and available test tools to make it happen

기사 2015-05-19

키사이트 현장 교정의 이점을 실현한 Thales Nederland - 사례 연구(영어)
Thales Nederland는 교정 처리시간이 오래 걸려 제품 배송 지연과 비용 초과를 겪었습니다. 키사이트는 현장 교정 솔루션으로 이러한 문제를 해결했습니다.

사례연구 2015-04-21

PDF PDF 50 KB
Thales Nederland Reaps the Benefits of Keysight Onsite Calibration - Case Study
Thales Nederland experienced product shipment delays and cost overruns due to long turn around times for calibration. Keysight solved their challenge with the solution of Onsite Calibration.

사례연구 2015-04-21

PDF PDF 50 KB
5G 파형 발생 및 분석을 위해 유연한 Testbed 구현 - 백서 (영어)
이 백서는 성능이 입증된 상용 소프트웨어 및 하드웨어를 포함하고 있는 유연한 5G testbed에 대해 설명하며, 5G 기술의 설계 및 테스트 과제에 대해서도 검토합니다.

기사 2015-04-20

PDF PDF 1.95 MB
Risk factors of Utilizing Unauthorized Third-Part Suppliers for In-Circuit Test - Case Study
This paper describes the potential risks customers may have to face by engaging services from unauthorized 3rd party suppliers for 3070 and i3070 products and services.

사례연구 2015-04-15

PDF PDF 2.02 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

기사 2015-04-02

PDF PDF 3.34 MB
Utilizing Commercial Best Practices for Success in NewSpace - Application Note
NewSpace is driving disruption that we haven’t seen since the original space race in the 1960’s. This paper describes the challenges that the new and unique business models put on electronic design and test strategies and processes. We will present ways to enable much higher volume with much lower cost while maintaining high quality.

기사 2015-03-31

PDF PDF 451 KB

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