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SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

應用手冊 2014-08-02

PDF PDF 1.94 MB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

應用手冊 2014-04-23

Essentials of Coherent Optical Data Transmission - Application Note
The Application Note explains how complex modulated optical signals can maximize bit transfer efficiency in fiber optical data transmission.

應用手冊 2014-04-02

PDF PDF 3.03 MB
High Speed Lightwave Component Analysis - Application Note
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

應用手冊 2014-02-26

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

應用手冊 2014-01-23

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

應用手冊 2013-11-18

Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

應用手冊 2013-10-28

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

應用手冊 2013-09-16

PDF PDF 1.78 MB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

應用手冊 2013-08-06

PDF PDF 6.63 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

應用手冊 2013-08-03

Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Keysight’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

應用手冊 2013-07-16

PDF PDF 2.23 MB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5 - Application Note
Serial ATA Interoperability Program Revision 1.5 Keysight MOI for SATA RSG Tests

應用手冊 2013-06-10

PDF PDF 2.45 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

應用手冊 2013-05-31

Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

應用手冊 2013-05-07

Radar Distance Test to Airborne Planes - Application Note
Keysight pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

應用手冊 2013-04-11

PDF PDF 904 KB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

應用手冊 2013-03-14

Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

應用手冊 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

應用手冊 2013-02-19

Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

應用手冊 2013-02-14

PDF PDF 793 KB
Technical Paper for Kalman Filter Based Modulation Analysis
Technical paper for Kalman Filter Based Modulation Analysis.

應用手冊 2012-11-28

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

應用手冊 2012-08-17

PDF PDF 942 KB
IVI-COM driver and VISA-COM I/O programming examples in Microsoft Visual C# - Application Note
This application note details the installation instructions and Visual C# programming examples for Keysight Technologies IVI-COM instrument drivers and VISA-COM I/O.

應用手冊 2012-07-30

PDF PDF 2.37 MB
Ten things to Consider when Selecting your Next Oscilloscope - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your needs is an important task. Comparing specs and features of scopes made by different manufacturers can be time-consuming and confusing. The concepts outlined here are intended to speed your selection process and help you avoid some common pitfalls. No matter who makes the scopes you are considering, carefully analyzing each one in relation to the 10 issues discussed here will help you evaluate the instruments objectively.

應用手冊 2012-05-15

All-states measurement method for PDL and PER with a synchronous polarization scrambler
This synchronized all-states PDL method using the Keysight N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results.

應用手冊 2012-03-27

PDF PDF 697 KB
S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

應用手冊 2012-03-01

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