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Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

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Recommendations for Port Setup When Using ADS Momentum and Modelithics Models
This application note is intended to help Advanced Design System (ADS) users using Modelithics models, simulate RF & Microwave circuits. The focus is on finding the optimum port setup for EM simulation of circuit layouts that include surface-mount technology (SMT) devices.

Application Note 2015-02-05

PDF PDF 1.43 MB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
LTE Reference Vector
A fresh approach to Comms PHY system design challenges.

Application Note 2015-01-20

PDF PDF 270 KB
Generating Multi-Dimensional Signals to Test Radar/EW Systems
This application note describes how to use SystemVue to generate multi-dimensional signals for testing Radar and modern Electronic Warfare (EW) systems.

Application Note 2014-11-09

PDF PDF 3.04 MB
Analysis of a transmission mode scanning microwave microscope for subsurface imaging at nanoscale
APPLIED PHYSICS LETTERS 105, 133112 (2014) - EMPro is used to characterize a SMM, a tool for calibrated capacitance measurements and dopant profiling in the semiconductor industry, as well as for many other diverse applications in biology, medicine and materials science.

Application Note 2014-10-02

Understanding the SystemVue To ADS Simulation Bridge - Application Note
This application note shows how RF designers using Advanced Design System (ADS), as well as system architects and DSP developers using SystemVue, can co-simulate for greater functionality and cross-platform debug and verification.

Application Note 2014-08-31

PDF PDF 1.95 MB
Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-08-04

An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2014-08-03

PDF PDF 5.89 MB
Solutions for Emerging 4G and WLAN Communications Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2014-08-03

Simulating Envelope Tracking with Advanced Design System Software - Application Note
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

PDF PDF 2.38 MB
Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2014-08-02

Simulation and Verification of Pulse Doppler Radar Systems - Application Note
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Application Note 2014-08-02

PDF PDF 10.44 MB
Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

FPGA Prototyping Using Keysight SystemVue
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Application Note 2014-08-01

Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2014-07-31

PDF PDF 531 KB
State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Overcoming the Challenges of Simulating Phased-Array Radar Systems
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Application Note 2014-02-26

3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
APPLIED PHYSICS LETTERS 103, 213106 (2013) - A theoretical analysis and numerical validation of a calibration algorithm for scanning microwave microscopy (SMM) imaging at the nanoscale.

Application Note 2013-11-19

Creating Multi-Emitter Signal Scenarios with COTS Software and Instrumentation – Solution Brief
Describes a key problem, describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-11-12

PDF PDF 1017 KB
EM Insights Series
The EM Insights series is a collection of EM applications from Keysight EEsof EDA.

Application Note 2013-05-06

Cost Savings in Creating Realistic Multi-Emitter Signal Scenarios
Describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-05-02

Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Keysight’s broad range of ESL applications, design functions and product areas.

Application Note 2013-04-02

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