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Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

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Analysis of a transmission mode scanning microwave microscope for subsurface imaging at nanoscale
APPLIED PHYSICS LETTERS 105, 133112 (2014) - EMPro is used to characterize a SMM, a tool for calibrated capacitance measurements and dopant profiling in the semiconductor industry, as well as for many other diverse applications in biology, medicine and materials science.

Application Note 2014-10-02

Understanding the SystemVue To ADS Simulation Bridge - Application Note
This application note shows how RF designers using Advanced Design System (ADS), as well as system architects and DSP developers using SystemVue, can co-simulate for greater functionality and cross-platform debug and verification.

Application Note 2014-08-31

An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

Simulating Envelope Tracking with Advanced Design System Software - Application Note
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-03-17

Overcoming the Challenges of Simulating Phased-Array Radar Systems
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Application Note 2014-02-26

Solutions for Emerging 4G and WLAN Communication Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2013-11-27

3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
APPLIED PHYSICS LETTERS 103, 213106 (2013) - A theoretical analysis and numerical validation of a calibration algorithm for scanning microwave microscopy (SMM) imaging at the nanoscale.

Application Note 2013-11-19

Creating Multi-Emitter Signal Scenarios with COTS Software and Instrumentation – Solution Brief
Describes a key problem, describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-11-12

Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2013-07-30

EM Insights Series
The EM Insights series is a collection of EM applications from Keysight EEsof EDA.

Application Note 2013-05-06

Cost Savings in Creating Realistic Multi-Emitter Signal Scenarios
Describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-05-02

Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Keysight’s broad range of ESL applications, design functions and product areas.

Application Note 2013-04-02

Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2013-03-28

A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology. The transceiver uses an on-off-keying UWB pulse modulation and is packaged in a standard QFN48L pre-molded cavity package with removable lid. The transceiver performances at 60-GHz was evaluated using the full wave 3D electromagnetic and the circuit cosimulation.

Application Note 2013-03-25

FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna. This model can further be used in a simulation test bench to verify the susceptibility of contactless RFID cards to RF interference from mobile phone transmissions. In this test bench the immunity test signals are injected into the contactless smart card under design within a model of a GTEM cell. A GTEM cell is used for this purpose because it is the only real-life test environment that allows exposing the DUT with a localized plane wave from 13.56 MHz up to multi-GHz frequencies. Our proposed methodology has been well verified by comparing simulations with measurements.

Application Note 2013-02-08

Equivalent Circuit Based Models For Surface Mount RLC Components
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.

Application Note 2013-02-06

Creating C++ Algorithms in SystemVue Using Model Builder
The SystemVue C++ Model Builder interface provides a powerful mechanism for exploring signal processing algorithms for communications system design.

Application Note 2012-11-14

Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.

Application Note 2012-11-01

Designing, Verifying and Testing Stepped Frequency Radar Systems for Commercial and A/D Applications
This note shows a simulation platform using SystemVue software that easily links measurement tools to enable the design, validation and test of SFR systems under different environments.

Application Note 2012-10-18

Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Application Note 2012-09-21

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