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Electronic Measurement

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Generating Multi-Dimensional Signals to Test Radar/EW Systems
This application note describes how to use SystemVue to generate multi-dimensional signals for testing Radar and modern Electronic Warfare (EW) systems.

Application Note 2014-11-09

PDF PDF 3.04 MB
Impedance Matching in the Laboratory - Application Note
Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2014-10-17

PDF PDF 501 KB
Transmission Lines and Reflected Signals - Application Note
Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2014-10-09

PDF PDF 596 KB
Understanding the SystemVue To ADS Simulation Bridge - Application Note
This application note shows how RF designers using Advanced Design System (ADS), as well as system architects and DSP developers using SystemVue, can co-simulate for greater functionality and cross-platform debug and verification.

Application Note 2014-08-31

PDF PDF 1.95 MB
Spectrum Analysis and the Frequency Domain - Application Note
Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2014-08-04

PDF PDF 280 KB
Solutions for Emerging 4G and WLAN Communications Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2014-08-03

Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2014-08-02

Simulation and Verification of Pulse Doppler Radar Systems - Application Note
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Application Note 2014-08-02

PDF PDF 10.44 MB
Simulating Envelope Tracking with Advanced Design System Software - Application Note
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

PDF PDF 2.38 MB
Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2014-06-13

PDF PDF 205 KB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-05-28

Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

Average Power Sensor Measurement Uncertainty Calculator - Application Note
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2014-03-25

XLS XLS 82 KB
Techniques for Precision Validation of Radar System Performance in the Field - Application Note
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance FieldFox combination analyzers.

Application Note 2014-03-18

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-03-17

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
Overcoming the Challenges of Simulating Phased-Array Radar Systems
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Application Note 2014-02-26

On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Application Note 2014-02-06

Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2013-11-17

Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

PDF PDF 1.91 MB
The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

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