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Enhancing Efficiency of EMI Pre-Compliance Testing with Advanced Software Capabilities - App Note
This application note describes the benefits of implementing EMC pre-compliance techniques using advanced software developed for that purpose.

Application Note 2016-05-12

Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-04-15

How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors- Application Note
Integrating USB Type-C into products, while ensuring interoperability and compliance, is challenging. This measurement brief covers USB Type-C cable and connector design and test solutions.

Application Note 2016-02-29

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2015-07-25

Enhance EMC Testing with Digital IF - Application Note
This application note will discuss the differences between analog and digital IF architecture and explain how digital IF enhances both compliance and precompliance measurement processes.

Application Note 2015-06-18

100 Gb/s Ethernet 100GBASE-CR4 Test Points and Test Fixtures - Application Note
This application note provides a detailed technical overview of 100GBASE-CR4 test point specifications and test fixtures to implement testing of physical media signals at the MDI and cable assemblies.

Application Note 2015-04-01

Using Microprobing, Modeling and Error Correction to Optimize Channel Design - Application Note
This application note will discuss step-by-step channel analysis methodologies using microprobing measurements with simulation and modeling tools to show accurate results to 20 GHz.

Application Note 2015-03-27

Characterization of PCB Insertion Loss with a New Calibration Method - Application Note
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2015-02-01

Streamline EMC Compliance Testing with Prescan Analysis Tools - Application Note
Application note

Application Note 2014-08-01

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

EMI Troubleshooting: The Need for Close Field Probes - Application Note

Application Note 2013-05-29

Accurate Absolute and Relative Power Measurements Using the N5531S - Application Note

Application Note 2012-12-04

Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Migrating Code from the 8903B to the U8903A - Application Note
This application note describes how to migrate the old commands used for HP 8903B to SCPI commands used by U8903A.

Application Note 2009-06-29

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

A Design of Experiments for Gigabit Serial Backplane Channels

Application Note 2008-09-03

Data Mining 12-Port S-Parameters

Application Note 2008-08-11

New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

Fast, Easy, and Accurate Microwave Phase Noise Measurements using the E5052B with the E5053A

Application Note 2008-05-22

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