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Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2015-02-13

Deploying the Ideal Test Solution for Handset Filters and Duplexers - Application Brief
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for handset filters and duplexers manufacturing test.

Application Note 2015-02-13

PDF PDF 437 KB
Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

Application Note 2015-02-11

PDF PDF 597 KB
Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.85 MB
Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.66 MB
Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.96 MB
Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.90 MB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2015-01-27

Power Flow and Directional Couplers - Application Note
Teaching Lab #6: Power Flow and Directional Couplers University Engineering Lab Series – Lab 6

Application Note 2014-12-09

PDF PDF 618 KB
Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2014-12-05

PDF PDF 690 KB
Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
Two-port Measurements and S-Parameters - Application Note
Teaching Lab # 5: Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2014-11-21

PDF PDF 576 KB
Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-11-05

PDF PDF 925 KB
Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Impedance Matching in the Laboratory - Application Note
Teaching Lab #4:Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2014-10-17

PDF PDF 501 KB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2014-10-11

PDF PDF 731 KB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
Transmission Lines and Reflected Signals - Application Note
Teaching Lab #3:Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2014-10-09

PDF PDF 596 KB
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-09-24

PDF PDF 2.34 MB
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR

Application Note 2014-08-28

PDF PDF 1.99 MB
Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-08-27

Spectrum Analysis and the Frequency Domain - Application Note
Teaching Lab #2: Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2014-08-04

PDF PDF 280 KB
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application Note 2014-08-03

Understanding and Using Offset in InfiniiMax Active Probes - Application Note
This application note explains how offset is applied in the Keysight InfiniiMax Active Probes and how to use offset for various applications

Application Note 2014-07-31

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