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PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

專文 2015-03-24

A Nonlinear Model Complier for RF/MICROWAVE Engineers
This Article presents Genesys latest release which includes a powerful Verilog-A compiler technology and hence enhancing the accuracy of simulation.

專文 2015-03-18

PDF PDF 536 KB
AWG M8195A won Lightwave award 2015
The 2015 Lightwave Innovation Award Elite Scores

專文 2015-03-17

University of Leeds Showcases Two Engineering Research Labs

專文 2015-02-11

Signal-Generation Advances Support Electronic Warfare’s Evolution

專文 2015-01-28

University of Utah Goes to Extremes to Investigate the Characteristics of Polar Ice
Read how Professors Ken Golden and Cynthia Furse and colleagues from the University of Utah used Keysight’s FieldFox handheld analyzer to measure the electromagnetic properties of polar ice

專文 2015-01-07

Signal-Generation Advances Support Electronic Warfare’s Evolution

專文 2014-12-31

PDF PDF 564 KB
是德科技榮獲 Frost & Sullivan 頒發 2014 年全球量測軟體市場領導獎 – 專文介紹

專文 2014-11-14

PDF PDF 1.97 MB
Determining the Best RF Simulation Tools as an RF Consulting Engineer
Independent consulting in RF and microwave engineering is a growing trend and many engineers are delivering their highly sought after RF expertise back to the industry.

專文 2014-11-06

PDF PDF 2.70 MB
Engineering Students in Brazil Learn with Hands-on Projects
Engineering Students in Brazil Learn with Hands-on Projects

專文 2014-10-28

IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research

專文 2014-10-16

AWG article - MWJ product feature
AWG article - MWJ product feature

專文 2014-10-14

MIT Lives Up to its Motto: Mind and Hand
MIT Lives Up to its Motto: Mind and Hand

專文 2014-09-21

HeatWave 技術文件
連結到 HeatWave 電熱分析軟體相關的各種技術文件。

專文 2014-08-27

How Product Innovation Happens: Customer Frustrations Spark Oscilloscope Triggering Idea - Article
This article is about how zone touch trigger came about, it first appeared in the March 2014 issue of Modern Test & Measure.

專文 2014-08-08

PDF PDF 834 KB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

專文 2014-08-04

PDF PDF 1.88 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

專文 2014-08-04

PDF PDF 3.32 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

專文 2014-08-04

PDF PDF 715 KB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

專文 2014-08-04

PDF PDF 1.18 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

專文 2014-08-04

PDF PDF 2.84 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

專文 2014-08-04

PDF PDF 8.20 MB
FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna.

專文 2014-08-03

PDF PDF 816 KB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

專文 2014-08-01

PDF PDF 201 KB
Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.

專文 2014-08-01

PDF PDF 3.07 MB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

專文 2014-07-31

PDF PDF 592 KB

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