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Reference Solutions - A New Approach to Test and Measurement Provisioning - Article Reprint
This article describes the Keysight Reference Solution approach to providing application specific HW and SW test configurations.

專文 2016-01-18

PDF PDF 565 KB
Using a Wide-Band Tunable Laser for Optical Filter Measurements – Article
This article was published in NASA Tech Briefs hard copy and online, highlighting how to use a wide-band tunable laser for optical filter measurements.

專文 2016-01-18

PDF PDF 1.82 MB
Keysight One Source Solutions Capabilities - Americas
View our capabilities for dimensional / optical; electrical – DC, low frequency; electrical – optical; electrical – RF, microwave, millimeter wave; physical / mechanical

專文 2016-01-08

2015 Global Digital Oscilloscopes Growth Award
Understand how Frost & Sullivan evaluates and decides on the winner for this award

專文 2016-01-05

PDF PDF 1.06 MB
IoT wireless sensors and the problem of short battery life
Electronic Product Design and Test, Dec 1, 2015 article

專文 2015-12-01

Flexible Testbed for 5G Waveform Generation and Analysis
While LTE and LTE-Advanced are still being deployed, research into next generation wireless networks is already in high gear.

專文 2015-11-13

Effective Maintenance + Troubleshooting of Earth Stations, SatMagazine - Article Reprint
This SatMagazine article describes how Keysight's handheld combination analyzers (FieldFox) can replace the full set of instruments previously used by satellite maintainers in the field.

專文 2015-11-12

PDF PDF 829 KB
PXIe Measurement Accelerator Speeds RF Power Amplifier Test - Article Reprint
This article, reprinted with permission from Microwave Journal, describes the speed improvement provided by Keysight's M9451A PXIe Measurement Accelerator.

專文 2015-11-11

PDF PDF 1.63 MB
5G air interfaces need channel measurements
EDN, Oct 31, 2015 article by Sheri DeTomasi discusses characterizing the radio channel to understand how the new 5G signals will propagate and describes a system that will provide the needed insights.

專文 2015-10-31

5G set to dramatically impact test and measurement
Canadian electronics, Oct 19, 2015 article by Roger Nichols discusses the challenges of testing in the investigations of the different 5G technologies.

專文 2015-10-19

Wireless Power Transfer Efficiency Test with ENA Series Network Analyzers
Option 006 wireless power transfer analysis software in ENA Series network analyzers enable wireless power transfer efficiency measurements in real-time. Advanced 2D/3D simulation feature visualizes the dependency of load impedance.

專文 2015-09-27

Keysight EEsof EDA makes it easy to get back to school—at least virtually
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

專文 2015-09-11

First 50 GHz Handheld Analyzer Speeds Field Work - Article Reprint
This MW Journal article reprint describes the new family of FieldFox analyzers - the industry's first 50 GHz handheld models, including how they can be effectively used in radar and satellite apps.

專文 2015-09-01

PDF PDF 1.24 MB
IEEE 802.11ah: Wi-Fi below 1 GHz
EDN, August 17, 2015 article by Kevin Qian & Mingyan Wang explains the new IEEE 802.11ah technology for IoT and the test challenges.

專文 2015-08-17

Modular Tester Performs 5G Channel Sounding
The 5G Channel Sounding Reference Solution test system features compact instrument modules and multiple software packages to generate and analyze complex waveforms for characterizing 5G wireless communications channels.

專文 2015-08-04

Challenges extend from simulation to compliance
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

專文 2015-07-08

Phase Noise, Amplitude and TOI Measurement Errors - Article Reprint
This article uses three key measurements to illustrate the need to periodically compare the performance of your instrument with the equipment's original data sheet specifications.

專文 2015-06-11

PDF PDF 675 KB
A Bead Probe CAD Strategy for In-Circuit Test - White Paper
IEEE article reprint discussing the potential of using bead probes in computer aided design (CAD) systems when getting a board ready for production.

專文 2015-06-08

PDF PDF 1.46 MB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

專文 2015-06-08

PDF PDF 1.86 MB
Determining the Best RF Simulation Tools as an RF Consulting Engineer
Independent consulting in RF and microwave engineering is a growing trend and many engineers are delivering their highly sought after RF expertise back to the industry.

專文 2015-06-08

PDF PDF 2.64 MB
Radar, Electronic Warfare, and Electronic Intelligence Testing: Identifying Common Test Challenges
This article reprint from Defense Technical Briefs covers common test challenges and radar basics. Radar, EW, and ELINT engineers make a variety of routine measurements. As highlighted earlier, pulse width and PRF or PRI provide important information about a radar system’s resolution and range.

專文 2015-06-08

PDF PDF 5.40 MB
Faster Testing with High-Performance Spectrum Analysis in a VNA - Article Reprint
Article reprint from the June 2015 issue of Microwave Journal highlighting the new spectrum analyzer option for the PNA Series.

專文 2015-06-01

PDF PDF 1.23 MB
The key to early 5G investigation – test tools for new network paradigms
Electronic Products and Technology, May 2015 article discusses the needs of 5G, areas of investigations and available test tools to make it happen

專文 2015-05-19

Implementing a Flexible Testbed for 5G Waveform Generation and Analysis - White Paper
This white paper describes a flexible 5G testbed that includes proven, off-the-shelf software and hardware; and also examines the challenges in design and test of 5G technology.

專文 2015-04-20

PDF PDF 1.95 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

專文 2015-04-02

PDF PDF 3.34 MB

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