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Temperature Effects in Integrated Circuits: What's Real?
Thermal effects have a significant impact on IC performance and reliability. This video shows how these effects can be analyzed with electrothermal simulation, allowing IC designers to address thermal problems before it’s too late.

Matériel de formation 2014-08-27

Keysight Line Sweep, Antenna Test Training - Data Sheet
Keysight Line Sweep, Antenna Test Training Data Sheet

Matériel de formation 2014-07-31

PDF PDF 112 KB
SI Analysis of Interconnects using EMPro-ADS Interoperability (KC login required)
This application demonstrates the ADS and EMPro interoperability feature by modeling high speed connectors SATA and USB.

Matériel de formation 2014-05-26

Pre-Layout Simulations for Generating PCB Layout Design Constraints (KC login required)
Designing Pre-layout Exploration for PCB Constraints Development.

Matériel de formation 2014-05-25

Automated Test / Board Test User Groups

Matériel de formation 2014-04-07

S-Parameter Measurements Basics for High Speed Digital Engineers - Slides
S-Parameter Measurements Basics for High Speed Digital Engineers

Matériel de formation 2014-01-22

PDF PDF 5.63 MB
Signal Integrity Characterization Techniques
Signal Integrity Characterization Techniques

Matériel de formation 2013-12-18

EMPro Course Overview
Outline of EMPro course

Matériel de formation 2013-11-11

PDF PDF 59 KB
Boundary Scan for Testing On-Board DDRs Webcast

Matériel de formation 2013-09-27

Signal Analysis of Differential Line using Line Engineer (KC login required)
This application demonstrates the use of two substrates, EM and Multilayer (ML) Substrate, in a single schematic to create a signal line, which can be further used for various analyses such as IBIS and TDR (using Line Engineer Design Guide).

Matériel de formation 2013-08-30

End to End Link Analysis using Retimer AMI Model (KC login required)
Analyze End-to-End channel link using mid-channel Retimer.

Matériel de formation 2013-05-23

AFM Bibliography

Matériel de formation 2013-04-16

Using RF Recording Techniques to Resolve Interference Problems

Matériel de formation 2013-02-22

Sample Lab Assignments
Keysight EEsof EDA Sample Lab Assignments

Matériel de formation 2012-10-31

View the recorded webcast - Coherent Detection of Polarization Multiplexed Amplitude

Matériel de formation 2012-03-16

Design and Test Challenges in Next Generation High-Speed Serial Standards
Attend this FREE education workshop at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference.

Matériel de formation 2011-11-29

View the recorded webcast - Introduction to MIPI device test
Introduction to MIPI device test

Matériel de formation 2011-11-08

View the recorded webcast - How to handle USB 3.0 physical layer test requirements
How to handle USB 3.0 physical layer test requirements.

Matériel de formation 2011-11-08

Nanoindenter Bibliography

Matériel de formation 2011-10-24

Agilent RF Interference Analysis Training Data Sheet
Hands-on training for RF engineers who install and maintain RF communications infrastructure using Agilent handheld RF instruments: N9340B spectrum analyzer and N9912A FieldFox RF analyzer.

Matériel de formation 2011-08-23

PDF PDF 155 KB
The AFM training video is available to all of our AFM users. Please click to register.

Matériel de formation 2011-07-25

Register for Agilent VEE e-Learning Courses (LearnVEE) Today at No Cost
LearnVEE is series of intuitive e-learning modules that cover Agilent VEE programming basics.

Matériel de formation 2011-05-26

Comparison of Momentum Simulation Results Using Quadrangle versus Triangle Mesh Elements
An ADS Momentum example showing a comparison of using quadrangle versus trianle mesh elements.

Matériel de formation 2011-05-25

PDF PDF 572 KB
Comparison of Simulation Results Using Quadrangles Versus Triangles
An ADS Momentum example showing a comparison of using quadrangle versus trianle mesh elements.

Matériel de formation 2011-05-25

PDF PDF 603 KB
View on demand webinar
Optimizing PXI Module Functional Test System Throughput

Matériel de formation 2011-05-06

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