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The Challenges of the Nanoscale Material and Device Characterization
IMS 2010 presentation by Hassan Tanbakuchi.

Seminar Materials 2010-05-26

PDF PDF 367 KB
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
IMS 2010 MicroApps presentation by Jan Verspecht, Jason Horn and David E. Root.

Seminar Materials 2010-05-26

PDF PDF 618 KB
Large-signal FET Model with Multiple Time Scale Dynamics from Nonlinear Vector Network Analyzer Data
IMS 2010 presentation by Jianjun Xu, Jason Horn, Masaya Iwamoto, and David E. Root.

Seminar Materials 2010-05-26

PDF PDF 273 KB
Content from the April, 2010 Automated Test / Board Test User Group Meeting - Cleveland
Adobe files of the material from the 2010 Cleveland User Group

Seminar Materials 2010-05-26

Accurate Mixer Measurements Using Multi-tone X-parameter Models
IMS 2010 MicroApps presentation by Mihai Marcu and Radoslaw M. Biernacki

Seminar Materials 2010-05-26

PDF PDF 215 KB
IMS 2010 MicroApps Keynote Speech on X-parameters
X-parameters: The Emerging Paradigm for Interoperable Characterization, Modeling, and Design of Nonlinear Microwave and RF Components and Systems

Seminar Materials 2010-05-26

PDF PDF 2.44 MB
Low Phase Noise Signal Generation and Measurement

Seminar Materials 2010-05-21

PDF PDF 967 KB
Pulse Generation & Analysis
IMS 2010 MicroApps presentation given by John Hansen.

Seminar Materials 2010-05-21

PDF PDF 1.35 MB
When Should You Apply 3D Planar EM Simulation?
IMS 2010 MicroApps paper presented by Andy Howard.

Seminar Materials 2010-05-21

PDF PDF 812 KB
A Survey of Load Pull Simulation Capabilities
IMS 2010 MicroApps presentation that describes how load pull simulation can help you design power amplifiers.

Seminar Materials 2010-05-19

PDF PDF 663 KB
RF Switch Design with Genesys
Using Agilent Genesys software in the design of RF antenna switches for LTE and WiMax applications

Seminar Materials 2010-05-14

PDF PDF 5.48 MB
Cleveland 3070 User Group - Web-PBQ Overview
Adobe file from 2010 Cleveland User Group

Seminar Materials 2010-05-10

PDF PDF 3.71 MB
Cleveland 3070 User Group - CCI - Bead Probe
Adobe file from 2010 Cleveland User Group

Seminar Materials 2010-05-10

PDF PDF 1.23 MB
Cleveland 3070 User Group - Boundary Scan
Adobe file from 2010 Cleveland User Group

Seminar Materials 2010-05-10

PDF PDF 1.16 MB
Cleveland 3070 User Group - Razor Presentation
Razor Presentation, Adobe file from 2010 Cleveland User Group

Seminar Materials 2010-05-10

PDF PDF 4.63 MB
Cleveland 3070 User Group - ICT Trends and Investments
Adobe file from 2010 Cleveland User Group

Seminar Materials 2010-05-10

PDF PDF 617 KB
Cleveland 3070 User Group - Sales Zoom 2 Notes
Sales Zoom 2 Notes, Adobe file from 2010 Cleveland User Group

Seminar Materials 2010-05-10

PDF PDF 9.17 MB
GoldenGate Users Networking Event during IEEE RFIC Symposium 2010, May 25th in Anaheim

Seminar Materials 2010-04-24

Signal Integrity Design Using Channel Simulation and EM Co-design
The materials in this self-guided workshop will show you the “what if” design space exploration workflow that our new statistical eye diagram channel simulator enables

Seminar Materials 2010-04-21

High Power Measurements using the Agilent Nonlinear Vector Network Analyzer

Seminar Materials 2010-04-14

PDF PDF 608 KB
Characterizing the Physical Layer of MIL-STD 1553 Differential Bus Networks
In this presentation you will learn how to quickly verify electrical/physical layer input and output characteristics and use eye-diagram mask testing to provide a composite measure of signal integrity of your MIL-STD 1553 serial buses.

Seminar Materials 2010-03-25

PPT PPT 4.63 MB
Power Amplifier Design for LTE
Using Agilent Genesys software to speed RF and microwave board designs for circuits and subsystems

Seminar Materials 2010-03-18

PDF PDF 5.61 MB
MMIC Design Seminar Materials
Keysight EEsof EDA collection of MMIC Design Seminar Materials.

Seminar Materials 2010-03-11

How to Prevent MMIC/RFIC Packaging Integration Failures

Seminar Materials 2010-03-04

PDF PDF 2.99 MB
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Seminar Materials 2010-02-01

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